Radiofrequency‐induced heating of broken and abandoned implant leads during magnetic resonance examinations

PURPOSE: The risks of RF‐induced heating of active implantable medical device (AIMD) leads during MR examinations must be well understood and realistically assessed. In this study, we evaluate the potential additional risks of broken and abandoned (cut) leads. METHODS: First, we defined a generic AI...

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Detalles Bibliográficos
Autores principales: Yao, Aiping, Goren, Tolga, Samaras, Theodoros, Kuster, Niels, Kainz, Wolfgang
Formato: Online Artículo Texto
Lenguaje:English
Publicado: John Wiley and Sons Inc. 2021
Materias:
Technical Note—Biophysics and Basic Biomedical Research
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8362172/
https://www.ncbi.nlm.nih.gov/pubmed/34080721
http://dx.doi.org/10.1002/mrm.28836

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8362172/
https://www.ncbi.nlm.nih.gov/pubmed/34080721
http://dx.doi.org/10.1002/mrm.28836

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