Dual-pulse photoactivated atomic force microscopy

Photoactivated atomic force microscopy (pAFM), which integrates light excitation and mechanical detection of the deflections of a cantilever tip, has become a widely used tool for probing nanoscale structures. Raising the illuminating laser power is an obvious way to boost the signal-to-noise ratio...

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Detalles Bibliográficos
Autores principales: Park, Byullee, Lee, Seunghyun, Kwon, Jimin, Kim, Woojo, Jung, Sungjune, Kim, Chulhong
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group UK 2021
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8384876/
https://www.ncbi.nlm.nih.gov/pubmed/34429492
http://dx.doi.org/10.1038/s41598-021-96646-4

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8384876/
https://www.ncbi.nlm.nih.gov/pubmed/34429492
http://dx.doi.org/10.1038/s41598-021-96646-4

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