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Detection of Electrical Circuit in a Thin-Film-Transistor Liquid-Crystal Display Using a Hybrid Optoelectronic Apparatus: An Array Tester and Automatic Optical Inspection

In this study, we developed a high-resolution, more accurate, non-destructive apparatus for refining the detection of electrode pixels in a thin-film-transistor liquid-crystal display (TFT-LCD). The hybrid optoelectronic apparatus simultaneously uses an array tester linked with the automatic optical...

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Autores principales: Tzu, Fu-Ming, Chen, Jung-Shun, Hsu, Shih-Hsien
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2021
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8399923/
https://www.ncbi.nlm.nih.gov/pubmed/34442586
http://dx.doi.org/10.3390/mi12080964
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author Tzu, Fu-Ming
Chen, Jung-Shun
Hsu, Shih-Hsien
author_facet Tzu, Fu-Ming
Chen, Jung-Shun
Hsu, Shih-Hsien
author_sort Tzu, Fu-Ming
collection PubMed
description In this study, we developed a high-resolution, more accurate, non-destructive apparatus for refining the detection of electrode pixels in a thin-film-transistor liquid-crystal display (TFT-LCD). The hybrid optoelectronic apparatus simultaneously uses an array tester linked with the automatic optical inspection of panel defects. Unfortunately, due to a tiny air gap in the electro-optical inspector, the situation repeatedly causes numerous scratches and damages to the modulator; therefore, developing alternative equipment is necessary. Typically, in TFT-LCDs, there are open, short, and cross short electrical defects. The experiment utilized a multiple-line scan with the time delay integration (TDI) of a charge-coupled device (CCD) to capture a sharp image, even under low light, various speeds, or extreme conditions. In addition, we explored the experimental efficacy of detecting the electrode pixel of the samples and evaluated the effectiveness of a 7-inch opaque quartz mask. The results show that an array tester and AOI can detect a TFT-LCD electrode pixel sufficiently; therefore, we recommend adopting the hybrid apparatus in the TFT-LCD industry.
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spelling pubmed-83999232021-08-29 Detection of Electrical Circuit in a Thin-Film-Transistor Liquid-Crystal Display Using a Hybrid Optoelectronic Apparatus: An Array Tester and Automatic Optical Inspection Tzu, Fu-Ming Chen, Jung-Shun Hsu, Shih-Hsien Micromachines (Basel) Article In this study, we developed a high-resolution, more accurate, non-destructive apparatus for refining the detection of electrode pixels in a thin-film-transistor liquid-crystal display (TFT-LCD). The hybrid optoelectronic apparatus simultaneously uses an array tester linked with the automatic optical inspection of panel defects. Unfortunately, due to a tiny air gap in the electro-optical inspector, the situation repeatedly causes numerous scratches and damages to the modulator; therefore, developing alternative equipment is necessary. Typically, in TFT-LCDs, there are open, short, and cross short electrical defects. The experiment utilized a multiple-line scan with the time delay integration (TDI) of a charge-coupled device (CCD) to capture a sharp image, even under low light, various speeds, or extreme conditions. In addition, we explored the experimental efficacy of detecting the electrode pixel of the samples and evaluated the effectiveness of a 7-inch opaque quartz mask. The results show that an array tester and AOI can detect a TFT-LCD electrode pixel sufficiently; therefore, we recommend adopting the hybrid apparatus in the TFT-LCD industry. MDPI 2021-08-15 /pmc/articles/PMC8399923/ /pubmed/34442586 http://dx.doi.org/10.3390/mi12080964 Text en © 2021 by the authors. https://creativecommons.org/licenses/by/4.0/Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (https://creativecommons.org/licenses/by/4.0/).
spellingShingle Article
Tzu, Fu-Ming
Chen, Jung-Shun
Hsu, Shih-Hsien
Detection of Electrical Circuit in a Thin-Film-Transistor Liquid-Crystal Display Using a Hybrid Optoelectronic Apparatus: An Array Tester and Automatic Optical Inspection
title Detection of Electrical Circuit in a Thin-Film-Transistor Liquid-Crystal Display Using a Hybrid Optoelectronic Apparatus: An Array Tester and Automatic Optical Inspection
title_full Detection of Electrical Circuit in a Thin-Film-Transistor Liquid-Crystal Display Using a Hybrid Optoelectronic Apparatus: An Array Tester and Automatic Optical Inspection
title_fullStr Detection of Electrical Circuit in a Thin-Film-Transistor Liquid-Crystal Display Using a Hybrid Optoelectronic Apparatus: An Array Tester and Automatic Optical Inspection
title_full_unstemmed Detection of Electrical Circuit in a Thin-Film-Transistor Liquid-Crystal Display Using a Hybrid Optoelectronic Apparatus: An Array Tester and Automatic Optical Inspection
title_short Detection of Electrical Circuit in a Thin-Film-Transistor Liquid-Crystal Display Using a Hybrid Optoelectronic Apparatus: An Array Tester and Automatic Optical Inspection
title_sort detection of electrical circuit in a thin-film-transistor liquid-crystal display using a hybrid optoelectronic apparatus: an array tester and automatic optical inspection
topic Article
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8399923/
https://www.ncbi.nlm.nih.gov/pubmed/34442586
http://dx.doi.org/10.3390/mi12080964
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