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Semi-Precise Analytical Method for Investigating the Liftoff Variation on the Hall Sensor in Metal Defect Sensing
Hall-effect sensors are used to detect metal surface defects both experimentally and numerically. The gap between the specimen and the sensor, called the liftoff, is assumed to remain constant, while a slight misplacement of a sample may lead to incorrect measurements by the Hall-effect sensor. This...
Autores principales: | , , |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
MDPI
2021
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8400565/ https://www.ncbi.nlm.nih.gov/pubmed/34450981 http://dx.doi.org/10.3390/s21165539 |
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author | Azad, Ali Lee, Jong-Jae Kim, Namgyu |
author_facet | Azad, Ali Lee, Jong-Jae Kim, Namgyu |
author_sort | Azad, Ali |
collection | PubMed |
description | Hall-effect sensors are used to detect metal surface defects both experimentally and numerically. The gap between the specimen and the sensor, called the liftoff, is assumed to remain constant, while a slight misplacement of a sample may lead to incorrect measurements by the Hall-effect sensor. This paper proposes a numerical simulation method to mitigate the liftoff issue. Owing to the complexity of conducting precise finite-element analysis, rather than obtaining the induced current in the Hall sensor, only the magnetic flux leakage is obtained. Thus, to achieve a better approximation, a numerical method capable of obtaining the induced current density in the circumferential direction in terms of the inspection direction is also proposed. Signals of the conventional and proposed approximate numerical methods affected by the sensor liftoff variation were obtained and compared. For small liftoffs, both conventional and proposed numerical methods could identify notch defects, while as the liftoff increased, no defect could be identified using the conventional numerical method. Furthermore, experiments were performed using a variety of liftoff configurations. Based on the results, considering the threshold of the conventional numerical method, defects were detected for greater liftoffs, but misdetection did not occur. |
format | Online Article Text |
id | pubmed-8400565 |
institution | National Center for Biotechnology Information |
language | English |
publishDate | 2021 |
publisher | MDPI |
record_format | MEDLINE/PubMed |
spelling | pubmed-84005652021-08-29 Semi-Precise Analytical Method for Investigating the Liftoff Variation on the Hall Sensor in Metal Defect Sensing Azad, Ali Lee, Jong-Jae Kim, Namgyu Sensors (Basel) Article Hall-effect sensors are used to detect metal surface defects both experimentally and numerically. The gap between the specimen and the sensor, called the liftoff, is assumed to remain constant, while a slight misplacement of a sample may lead to incorrect measurements by the Hall-effect sensor. This paper proposes a numerical simulation method to mitigate the liftoff issue. Owing to the complexity of conducting precise finite-element analysis, rather than obtaining the induced current in the Hall sensor, only the magnetic flux leakage is obtained. Thus, to achieve a better approximation, a numerical method capable of obtaining the induced current density in the circumferential direction in terms of the inspection direction is also proposed. Signals of the conventional and proposed approximate numerical methods affected by the sensor liftoff variation were obtained and compared. For small liftoffs, both conventional and proposed numerical methods could identify notch defects, while as the liftoff increased, no defect could be identified using the conventional numerical method. Furthermore, experiments were performed using a variety of liftoff configurations. Based on the results, considering the threshold of the conventional numerical method, defects were detected for greater liftoffs, but misdetection did not occur. MDPI 2021-08-17 /pmc/articles/PMC8400565/ /pubmed/34450981 http://dx.doi.org/10.3390/s21165539 Text en © 2021 by the authors. https://creativecommons.org/licenses/by/4.0/Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (https://creativecommons.org/licenses/by/4.0/). |
spellingShingle | Article Azad, Ali Lee, Jong-Jae Kim, Namgyu Semi-Precise Analytical Method for Investigating the Liftoff Variation on the Hall Sensor in Metal Defect Sensing |
title | Semi-Precise Analytical Method for Investigating the Liftoff Variation on the Hall Sensor in Metal Defect Sensing |
title_full | Semi-Precise Analytical Method for Investigating the Liftoff Variation on the Hall Sensor in Metal Defect Sensing |
title_fullStr | Semi-Precise Analytical Method for Investigating the Liftoff Variation on the Hall Sensor in Metal Defect Sensing |
title_full_unstemmed | Semi-Precise Analytical Method for Investigating the Liftoff Variation on the Hall Sensor in Metal Defect Sensing |
title_short | Semi-Precise Analytical Method for Investigating the Liftoff Variation on the Hall Sensor in Metal Defect Sensing |
title_sort | semi-precise analytical method for investigating the liftoff variation on the hall sensor in metal defect sensing |
topic | Article |
url | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8400565/ https://www.ncbi.nlm.nih.gov/pubmed/34450981 http://dx.doi.org/10.3390/s21165539 |
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