Structural Characteristics of the Si Whiskers Grown by Ni-Metal-Induced-Lateral-Crystallization

Si whiskers grown by Ni-Metal-Induced-Lateral-Crystallization (Ni-MILC) were grown at 413 °C, intentionally below the threshold for Solid State Crystallization, which is 420 °C. These whiskers have significant common characteristics with whiskers grown by the Vapor Liquid Solid (VLS) method. The cry...

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Detalles Bibliográficos
Autores principales: Pécz, Béla, Vouroutzis, Nikolaos, Radnóczi, György Zoltán, Frangis, Nikolaos, Stoemenos, John
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2021
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8402106/
https://www.ncbi.nlm.nih.gov/pubmed/34443708
http://dx.doi.org/10.3390/nano11081878

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8402106/
https://www.ncbi.nlm.nih.gov/pubmed/34443708
http://dx.doi.org/10.3390/nano11081878

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