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Beam heating from a fourth-generation synchrotron source

The high levels of flux available at a fourth-generation synchrotron are shown to have significant beam heating effects for high-energy X-rays and radiation hard samples, leading to temperature increases of over 400 K with a monochromatic beam. These effects have been investigated at the ID11 beamli...

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Detalles Bibliográficos
Autores principales: Lawrence Bright, Eleanor, Giacobbe, Carlotta, Wright, Jonathan P.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: International Union of Crystallography 2021
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8415326/
https://www.ncbi.nlm.nih.gov/pubmed/34475286
http://dx.doi.org/10.1107/S160057752100669X
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author Lawrence Bright, Eleanor
Giacobbe, Carlotta
Wright, Jonathan P.
author_facet Lawrence Bright, Eleanor
Giacobbe, Carlotta
Wright, Jonathan P.
author_sort Lawrence Bright, Eleanor
collection PubMed
description The high levels of flux available at a fourth-generation synchrotron are shown to have significant beam heating effects for high-energy X-rays and radiation hard samples, leading to temperature increases of over 400 K with a monochromatic beam. These effects have been investigated at the ID11 beamline at the recently upgraded ESRF Extremely Brilliant Source, using thermal lattice expansion to perform in situ measurements of beam heating. Results showed significant increases in temperature for metal and ceria samples, which are compared with a lumped thermodynamic model, providing a tool for estimating beam heating effects. These temperature increases may have a drastic effect on samples and measurements, such as the rapid recrystallization of a copper wire shown here. These results demonstrate the importance of beam heating and provide information needed to consider, predict and mitigate these effects.
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spelling pubmed-84153262021-09-16 Beam heating from a fourth-generation synchrotron source Lawrence Bright, Eleanor Giacobbe, Carlotta Wright, Jonathan P. J Synchrotron Radiat Research Papers The high levels of flux available at a fourth-generation synchrotron are shown to have significant beam heating effects for high-energy X-rays and radiation hard samples, leading to temperature increases of over 400 K with a monochromatic beam. These effects have been investigated at the ID11 beamline at the recently upgraded ESRF Extremely Brilliant Source, using thermal lattice expansion to perform in situ measurements of beam heating. Results showed significant increases in temperature for metal and ceria samples, which are compared with a lumped thermodynamic model, providing a tool for estimating beam heating effects. These temperature increases may have a drastic effect on samples and measurements, such as the rapid recrystallization of a copper wire shown here. These results demonstrate the importance of beam heating and provide information needed to consider, predict and mitigate these effects. International Union of Crystallography 2021-07-20 /pmc/articles/PMC8415326/ /pubmed/34475286 http://dx.doi.org/10.1107/S160057752100669X Text en © Eleanor Lawrence Bright et al. 2021 https://creativecommons.org/licenses/by/4.0/This is an open-access article distributed under the terms of the Creative Commons Attribution (CC-BY) Licence, which permits unrestricted use, distribution, and reproduction in any medium, provided the original authors and source are cited.
spellingShingle Research Papers
Lawrence Bright, Eleanor
Giacobbe, Carlotta
Wright, Jonathan P.
Beam heating from a fourth-generation synchrotron source
title Beam heating from a fourth-generation synchrotron source
title_full Beam heating from a fourth-generation synchrotron source
title_fullStr Beam heating from a fourth-generation synchrotron source
title_full_unstemmed Beam heating from a fourth-generation synchrotron source
title_short Beam heating from a fourth-generation synchrotron source
title_sort beam heating from a fourth-generation synchrotron source
topic Research Papers
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8415326/
https://www.ncbi.nlm.nih.gov/pubmed/34475286
http://dx.doi.org/10.1107/S160057752100669X
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