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Off-axis multilayer zone plate with 16 nm × 28 nm focus for high-resolution X-ray beam induced current imaging
Using multilayer zone plates (MZPs) as two-dimensional optics, focal spot sizes of less than 10 nm can be achieved, as we show here with a focus of 8.4 nm × 9.6 nm, but the need for order-sorting apertures prohibits practical working distances. To overcome this issue, here an off-axis illumination o...
Autores principales: | , , , , |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
International Union of Crystallography
2021
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8415331/ https://www.ncbi.nlm.nih.gov/pubmed/34475304 http://dx.doi.org/10.1107/S1600577521006159 |
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author | Soltau, Jakob Chayanun, Lert Lyubomirskiy, Mikhail Wallentin, Jesper Osterhoff, Markus |
author_facet | Soltau, Jakob Chayanun, Lert Lyubomirskiy, Mikhail Wallentin, Jesper Osterhoff, Markus |
author_sort | Soltau, Jakob |
collection | PubMed |
description | Using multilayer zone plates (MZPs) as two-dimensional optics, focal spot sizes of less than 10 nm can be achieved, as we show here with a focus of 8.4 nm × 9.6 nm, but the need for order-sorting apertures prohibits practical working distances. To overcome this issue, here an off-axis illumination of a circular MZP is introduced to trade off between working distance and focal spot size. By this, the working distance between order-sorting aperture and sample can be more than doubled. Exploiting a 2D focus of 16 nm × 28 nm, real-space 2D mapping of local electric fields and charge carrier recombination using X-ray beam induced current in a single InP nanowire is demonstrated. Simulations show that a dedicated off-axis MZP can reach sub-10 nm focusing combined with reasonable working distances and low background, which could be used for in operando imaging of composition, carrier collection and strain in nanostructured devices. |
format | Online Article Text |
id | pubmed-8415331 |
institution | National Center for Biotechnology Information |
language | English |
publishDate | 2021 |
publisher | International Union of Crystallography |
record_format | MEDLINE/PubMed |
spelling | pubmed-84153312021-09-16 Off-axis multilayer zone plate with 16 nm × 28 nm focus for high-resolution X-ray beam induced current imaging Soltau, Jakob Chayanun, Lert Lyubomirskiy, Mikhail Wallentin, Jesper Osterhoff, Markus J Synchrotron Radiat Research Papers Using multilayer zone plates (MZPs) as two-dimensional optics, focal spot sizes of less than 10 nm can be achieved, as we show here with a focus of 8.4 nm × 9.6 nm, but the need for order-sorting apertures prohibits practical working distances. To overcome this issue, here an off-axis illumination of a circular MZP is introduced to trade off between working distance and focal spot size. By this, the working distance between order-sorting aperture and sample can be more than doubled. Exploiting a 2D focus of 16 nm × 28 nm, real-space 2D mapping of local electric fields and charge carrier recombination using X-ray beam induced current in a single InP nanowire is demonstrated. Simulations show that a dedicated off-axis MZP can reach sub-10 nm focusing combined with reasonable working distances and low background, which could be used for in operando imaging of composition, carrier collection and strain in nanostructured devices. International Union of Crystallography 2021-07-22 /pmc/articles/PMC8415331/ /pubmed/34475304 http://dx.doi.org/10.1107/S1600577521006159 Text en © Jakob Soltau et al. 2021 https://creativecommons.org/licenses/by/4.0/This is an open-access article distributed under the terms of the Creative Commons Attribution (CC-BY) Licence, which permits unrestricted use, distribution, and reproduction in any medium, provided the original authors and source are cited. |
spellingShingle | Research Papers Soltau, Jakob Chayanun, Lert Lyubomirskiy, Mikhail Wallentin, Jesper Osterhoff, Markus Off-axis multilayer zone plate with 16 nm × 28 nm focus for high-resolution X-ray beam induced current imaging |
title | Off-axis multilayer zone plate with 16 nm × 28 nm focus for high-resolution X-ray beam induced current imaging |
title_full | Off-axis multilayer zone plate with 16 nm × 28 nm focus for high-resolution X-ray beam induced current imaging |
title_fullStr | Off-axis multilayer zone plate with 16 nm × 28 nm focus for high-resolution X-ray beam induced current imaging |
title_full_unstemmed | Off-axis multilayer zone plate with 16 nm × 28 nm focus for high-resolution X-ray beam induced current imaging |
title_short | Off-axis multilayer zone plate with 16 nm × 28 nm focus for high-resolution X-ray beam induced current imaging |
title_sort | off-axis multilayer zone plate with 16 nm × 28 nm focus for high-resolution x-ray beam induced current imaging |
topic | Research Papers |
url | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8415331/ https://www.ncbi.nlm.nih.gov/pubmed/34475304 http://dx.doi.org/10.1107/S1600577521006159 |
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