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Beam and sample movement compensation for robust spectro-microscopy measurements on a hard X-ray nanoprobe
Static and in situ nanoscale spectro-microscopy is now routinely performed on the Hard X-ray Nanoprobe beamline at Diamond and the solutions implemented to provide robust energy scanning and experimental operation are described. A software-based scheme for active feedback stabilization of X-ray beam...
| Autores principales: | , , , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
International Union of Crystallography
2021
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| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8415335/ https://www.ncbi.nlm.nih.gov/pubmed/34475300 http://dx.doi.org/10.1107/S1600577521007736 |