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Hard X-ray nanoprobe scanner

X-ray scientists are continually striving to improve the quality of X-ray microscopy, due to the fact that the information obtained from X-ray microscopy of materials can be complementary to that obtained from optical and electron microscopes. In contrast to the ease with which one can deflect elect...

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Detalles Bibliográficos
Autores principales:	Yamada, Jumpei, Inoue, Ichiro, Osaka, Taito, Inoue, Takato, Matsuyama, Satoshi, Yamauchi, Kazuto, Yabashi, Makina
Formato:	Online Artículo Texto
Lenguaje:	English
Publicado:	International Union of Crystallography 2021
Materias:	Research Letters
Acceso en línea:	https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8420768/ https://www.ncbi.nlm.nih.gov/pubmed/34584733 http://dx.doi.org/10.1107/S2052252521007004

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