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Impact of electrical grounding conditions on plasma–liquid interactions using Thomson scattering on a pulsed argon jet

The interaction between an argon plasma jet excited using microsecond duration voltage pulses and a liquid target was examined using Thomson scattering to quantify the temporal evolution of the electron density and temperature. The electrical resistance between a liquid target and the electrical gro...

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Detalles Bibliográficos
Autores principales: Slikboer, Elmar, Walsh, James
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group UK 2021
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8423766/
https://www.ncbi.nlm.nih.gov/pubmed/34493756
http://dx.doi.org/10.1038/s41598-021-97185-8
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author Slikboer, Elmar
Walsh, James
author_facet Slikboer, Elmar
Walsh, James
author_sort Slikboer, Elmar
collection PubMed
description The interaction between an argon plasma jet excited using microsecond duration voltage pulses and a liquid target was examined using Thomson scattering to quantify the temporal evolution of the electron density and temperature. The electrical resistance between a liquid target and the electrical ground was varied from 1 to [Formula: see text] to mimic different conductivity liquids while the influence of the varying electrical properties on the electron dynamics within the plasma were examined. It was demonstrated that the interaction between the plasma jet and a liquid target grounded via a high resistance resulted in typical dielectric barrier discharge behaviour, with two discharge events per applied voltage pulse. Under such conditions, the electron density and temperature reached a peak of [Formula: see text] and 3.4 eV, respectively; with both rapidly decaying over several hundreds of nanoseconds. For liquid targets grounded via a low resistance, the jet behaviour transitioned to a DC-like discharge, with a single breakdown event being observed and sustained throughout the duration of each applied voltage pulse. Under such conditions, electron densities of [Formula: see text] were detected for several microseconds. The results demonstrate that the electron dynamics in a pulsed argon plasma jet are extremely sensitive to the electrical characteristics of the target, which in the case of water, can evolve during exposure to the plasma.
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spelling pubmed-84237662021-09-09 Impact of electrical grounding conditions on plasma–liquid interactions using Thomson scattering on a pulsed argon jet Slikboer, Elmar Walsh, James Sci Rep Article The interaction between an argon plasma jet excited using microsecond duration voltage pulses and a liquid target was examined using Thomson scattering to quantify the temporal evolution of the electron density and temperature. The electrical resistance between a liquid target and the electrical ground was varied from 1 to [Formula: see text] to mimic different conductivity liquids while the influence of the varying electrical properties on the electron dynamics within the plasma were examined. It was demonstrated that the interaction between the plasma jet and a liquid target grounded via a high resistance resulted in typical dielectric barrier discharge behaviour, with two discharge events per applied voltage pulse. Under such conditions, the electron density and temperature reached a peak of [Formula: see text] and 3.4 eV, respectively; with both rapidly decaying over several hundreds of nanoseconds. For liquid targets grounded via a low resistance, the jet behaviour transitioned to a DC-like discharge, with a single breakdown event being observed and sustained throughout the duration of each applied voltage pulse. Under such conditions, electron densities of [Formula: see text] were detected for several microseconds. The results demonstrate that the electron dynamics in a pulsed argon plasma jet are extremely sensitive to the electrical characteristics of the target, which in the case of water, can evolve during exposure to the plasma. Nature Publishing Group UK 2021-09-07 /pmc/articles/PMC8423766/ /pubmed/34493756 http://dx.doi.org/10.1038/s41598-021-97185-8 Text en © The Author(s) 2021 https://creativecommons.org/licenses/by/4.0/Open AccessThis article is licensed under a Creative Commons Attribution 4.0 International License, which permits use, sharing, adaptation, distribution and reproduction in any medium or format, as long as you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons licence, and indicate if changes were made. The images or other third party material in this article are included in the article's Creative Commons licence, unless indicated otherwise in a credit line to the material. If material is not included in the article's Creative Commons licence and your intended use is not permitted by statutory regulation or exceeds the permitted use, you will need to obtain permission directly from the copyright holder. To view a copy of this licence, visit http://creativecommons.org/licenses/by/4.0/ (https://creativecommons.org/licenses/by/4.0/) .
spellingShingle Article
Slikboer, Elmar
Walsh, James
Impact of electrical grounding conditions on plasma–liquid interactions using Thomson scattering on a pulsed argon jet
title Impact of electrical grounding conditions on plasma–liquid interactions using Thomson scattering on a pulsed argon jet
title_full Impact of electrical grounding conditions on plasma–liquid interactions using Thomson scattering on a pulsed argon jet
title_fullStr Impact of electrical grounding conditions on plasma–liquid interactions using Thomson scattering on a pulsed argon jet
title_full_unstemmed Impact of electrical grounding conditions on plasma–liquid interactions using Thomson scattering on a pulsed argon jet
title_short Impact of electrical grounding conditions on plasma–liquid interactions using Thomson scattering on a pulsed argon jet
title_sort impact of electrical grounding conditions on plasma–liquid interactions using thomson scattering on a pulsed argon jet
topic Article
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8423766/
https://www.ncbi.nlm.nih.gov/pubmed/34493756
http://dx.doi.org/10.1038/s41598-021-97185-8
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