Accuracy of HVL measurements utilizing solid state detectors for radiography and fluoroscopy X‐ray systems

The half‐value layer (HVL) is one of the regulatory required radiation safety parameters that needs to be measured annually. With the advent of solid state detectors and their associated electrometer assembly, the HVL measurement can be conducted with relative ease. In fact, various radiological technique parameters such as tube potential (kV), exposure time in millisecond (msec), air kerma (mGy), and air kerma rate (mGy/sec) can be obtained along with the HVL with just one exposure. The measured (or, calculated) HVL is based on radiation detection systems calibrated for conventional x‐ray systems equipped with tungsten anode and added aluminum filters (molybdenum anode and filter in the case of mammography systems). However, a new generation of radiography and fluoroscopy (R/F) systems, inclusive of interventional angiography equipment, is equipped with varying thicknesses and materials of spectral shaping filters (SSF) to minimize the radiation exposure to the patients while image quality is maintained and optimized. The accuracy of HVL obtained with new generation of R/F systems has not been investigated in depth due to the addition of spectral filters yielding a harder beam quality with a higher HVL than the regulatory required value of 2.9 mm Al HVL at 80 kV. It would be of great interest to determine the accuracy of HVL as measured (or, calculated) by the solid state detector systems (SSDS), especially when accurate radiation dose delivered to the patient is required. In this investigation, the subject is limited to the accuracy of HVL measurement for conventional R/F systems.