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Deep-Compact-Clustering Based Anomaly Detection Applied to Electromechanical Industrial Systems

The rapid growth in the industrial sector has required the development of more productive and reliable machinery, and therefore, leads to complex systems. In this regard, the automatic detection of unknown events in machinery represents a greater challenge, since uncharacterized catastrophic faults...

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Autores principales: Arellano-Espitia, Francisco, Delgado-Prieto, Miguel, Gonzalez-Abreu, Artvin-Darien, Saucedo-Dorantes, Juan Jose, Osornio-Rios, Roque Alfredo
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2021
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8433707/
https://www.ncbi.nlm.nih.gov/pubmed/34502724
http://dx.doi.org/10.3390/s21175830
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author Arellano-Espitia, Francisco
Delgado-Prieto, Miguel
Gonzalez-Abreu, Artvin-Darien
Saucedo-Dorantes, Juan Jose
Osornio-Rios, Roque Alfredo
author_facet Arellano-Espitia, Francisco
Delgado-Prieto, Miguel
Gonzalez-Abreu, Artvin-Darien
Saucedo-Dorantes, Juan Jose
Osornio-Rios, Roque Alfredo
author_sort Arellano-Espitia, Francisco
collection PubMed
description The rapid growth in the industrial sector has required the development of more productive and reliable machinery, and therefore, leads to complex systems. In this regard, the automatic detection of unknown events in machinery represents a greater challenge, since uncharacterized catastrophic faults can occur. However, the existing methods for anomaly detection present limitations when dealing with highly complex industrial systems. For that purpose, a novel fault diagnosis methodology is developed to face the anomaly detection. An unsupervised anomaly detection framework named deep-autoencoder-compact-clustering one-class support-vector machine (DAECC-OC-SVM) is presented, which aims to incorporate the advantages of automatically learnt representation by deep neural network to improved anomaly detection performance. The method combines the training of a deep-autoencoder with clustering compact model and a one-class support-vector-machine function-based outlier detection method. The addressed methodology is applied on a public rolling bearing faults experimental test bench and on multi-fault experimental test bench. The results show that the proposed methodology it is able to accurately to detect unknown defects, outperforming other state-of-the-art methods.
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spelling pubmed-84337072021-09-12 Deep-Compact-Clustering Based Anomaly Detection Applied to Electromechanical Industrial Systems Arellano-Espitia, Francisco Delgado-Prieto, Miguel Gonzalez-Abreu, Artvin-Darien Saucedo-Dorantes, Juan Jose Osornio-Rios, Roque Alfredo Sensors (Basel) Article The rapid growth in the industrial sector has required the development of more productive and reliable machinery, and therefore, leads to complex systems. In this regard, the automatic detection of unknown events in machinery represents a greater challenge, since uncharacterized catastrophic faults can occur. However, the existing methods for anomaly detection present limitations when dealing with highly complex industrial systems. For that purpose, a novel fault diagnosis methodology is developed to face the anomaly detection. An unsupervised anomaly detection framework named deep-autoencoder-compact-clustering one-class support-vector machine (DAECC-OC-SVM) is presented, which aims to incorporate the advantages of automatically learnt representation by deep neural network to improved anomaly detection performance. The method combines the training of a deep-autoencoder with clustering compact model and a one-class support-vector-machine function-based outlier detection method. The addressed methodology is applied on a public rolling bearing faults experimental test bench and on multi-fault experimental test bench. The results show that the proposed methodology it is able to accurately to detect unknown defects, outperforming other state-of-the-art methods. MDPI 2021-08-30 /pmc/articles/PMC8433707/ /pubmed/34502724 http://dx.doi.org/10.3390/s21175830 Text en © 2021 by the authors. https://creativecommons.org/licenses/by/4.0/Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (https://creativecommons.org/licenses/by/4.0/).
spellingShingle Article
Arellano-Espitia, Francisco
Delgado-Prieto, Miguel
Gonzalez-Abreu, Artvin-Darien
Saucedo-Dorantes, Juan Jose
Osornio-Rios, Roque Alfredo
Deep-Compact-Clustering Based Anomaly Detection Applied to Electromechanical Industrial Systems
title Deep-Compact-Clustering Based Anomaly Detection Applied to Electromechanical Industrial Systems
title_full Deep-Compact-Clustering Based Anomaly Detection Applied to Electromechanical Industrial Systems
title_fullStr Deep-Compact-Clustering Based Anomaly Detection Applied to Electromechanical Industrial Systems
title_full_unstemmed Deep-Compact-Clustering Based Anomaly Detection Applied to Electromechanical Industrial Systems
title_short Deep-Compact-Clustering Based Anomaly Detection Applied to Electromechanical Industrial Systems
title_sort deep-compact-clustering based anomaly detection applied to electromechanical industrial systems
topic Article
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8433707/
https://www.ncbi.nlm.nih.gov/pubmed/34502724
http://dx.doi.org/10.3390/s21175830
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