In-Line Measurement of the Surface Texture of Rolls Using Long Slender Piezoresistive Microprobes

Long slender piezoresistive silicon microprobes are a new type of sensor for measurement of surface roughness. Their advantage is the ability to measure at speeds of up to 15 mm/s, which is much faster than conventional stylus probes. The drawbacks are their small measurement range and tendency to b...

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Detalles Bibliográficos
Autores principales: Teir, Linus, Lindstedt, Tuomas, Widmaier, Thomas, Hemming, Björn, Brand, Uwe, Fahrbach, Michael, Peiner, Erwin, Lassila, Antti
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2021
Materias:
Communication
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8434642/
https://www.ncbi.nlm.nih.gov/pubmed/34502846
http://dx.doi.org/10.3390/s21175955

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8434642/
https://www.ncbi.nlm.nih.gov/pubmed/34502846
http://dx.doi.org/10.3390/s21175955

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