Cargando…
In-Line Measurement of the Surface Texture of Rolls Using Long Slender Piezoresistive Microprobes
Long slender piezoresistive silicon microprobes are a new type of sensor for measurement of surface roughness. Their advantage is the ability to measure at speeds of up to 15 mm/s, which is much faster than conventional stylus probes. The drawbacks are their small measurement range and tendency to b...
| Autores principales: | , , , , , , , |
|---|---|
| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
MDPI
2021
|
| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8434642/ https://www.ncbi.nlm.nih.gov/pubmed/34502846 http://dx.doi.org/10.3390/s21175955 |