Heterojunction structures for reduced noise in large-area and sensitive perovskite x-ray detectors

Polycrystalline perovskites can be readily fabricated into large areas using solution depositions; however, they suffer from large dark currents that are tens to hundreds times higher than industrially relevant values, limiting their application in low-dose x-ray detection. Here, we show that the application of a heterojunction structure into polycrystalline films significantly reduces the dark current density by more than 200 times to subnanoampere per square centimeter without reducing the sensitivity of the detectors. The heterojunction perovskite films are formed by laminating several membrane films filled with perovskites of different bandgaps. A gradient bandgap is formed during annealing. The detectors have a lowest detectable dose rate of 13.8 ± 0.29 nGy(air) s(−1) for 40-keV x-ray and can conduct dynamic x-ray imaging at a low-dose rate of 32.2 nGy(air) s(−1). Simulation and experimental analysis show that the heterojunction is tolerant of halide diffusion and can be stable for over 15 years.