Determining the Preferred Orientation of Silver-Plating via X-ray Diffraction Profile

Determining the preferred orientation of plating film is of practical importance. In this work, the Rietveld method and quantitative texture analysis (RM+QTA) are used to analyze the preferred orientation of plating silver film with XRD profile, whose <311> axial texture can be completely desc...

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Detalles Bibliográficos
Autores principales: Li, Taotao, Zheng, Liuwei, Zhang, Wanggang, Zhu, Pengfei
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2021
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8466463/
https://www.ncbi.nlm.nih.gov/pubmed/34578733
http://dx.doi.org/10.3390/nano11092417

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8466463/
https://www.ncbi.nlm.nih.gov/pubmed/34578733
http://dx.doi.org/10.3390/nano11092417

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