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Determining the Preferred Orientation of Silver-Plating via X-ray Diffraction Profile
Determining the preferred orientation of plating film is of practical importance. In this work, the Rietveld method and quantitative texture analysis (RM+QTA) are used to analyze the preferred orientation of plating silver film with XRD profile, whose <311> axial texture can be completely desc...
| Autores principales: | , , , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
MDPI
2021
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| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8466463/ https://www.ncbi.nlm.nih.gov/pubmed/34578733 http://dx.doi.org/10.3390/nano11092417 |