Two-Dimensional Perovskite Crystals Formed by Atomic Layer Deposition of CaTiO(3) on γ-Al(2)O(3)

CaTiO(3) films with an average thickness of 0.5 nm were deposited onto γ-Al(2)O(3) by Atomic Layer Deposition (ALD) and then characterized by a range of techniques, including X-ray Diffraction (XRD) and High-Resolution, Transmission Electron Microscopy (HRTEM). The results demonstrate that the films...

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Detalles Bibliográficos
Autores principales: Cao, Tianyu, Kwon, Ohhun, Lin, Chao, Vohs, John M., Gorte, Raymond J.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2021
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8469333/
https://www.ncbi.nlm.nih.gov/pubmed/34578523
http://dx.doi.org/10.3390/nano11092207
Descripción
Sumario:CaTiO(3) films with an average thickness of 0.5 nm were deposited onto γ-Al(2)O(3) by Atomic Layer Deposition (ALD) and then characterized by a range of techniques, including X-ray Diffraction (XRD) and High-Resolution, Transmission Electron Microscopy (HRTEM). The results demonstrate that the films form two-dimensional crystallites over the entire surface. Lattice fringes from HRTEM indicate that the crystallites range in size from 5 to 20 nm and are oriented in various directions. Films of the same thickness on SiO(2) remained amorphous, indicating that the support played a role in forming the crystallites.

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