Thickness Effect on Some Physical Properties of RF Sputtered ZnTe Thin Films for Potential Photovoltaic Applications

Zinc telluride thin films with different thicknesses were grown onto glass substrates by the rf magnetron sputtering technique, using time as a variable growth parameter. All other deposition process parameters were kept constant. The deposited thin films with thickness from 75 to 460 nm were charac...

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Detalles Bibliográficos
Autores principales: Manica, Dumitru, Antohe, Vlad-Andrei, Moldovan, Antoniu, Pascu, Rovena, Iftimie, Sorina, Ion, Lucian, Suchea, Mirela Petruta, Antohe, Ştefan
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2021
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8472151/
https://www.ncbi.nlm.nih.gov/pubmed/34578602
http://dx.doi.org/10.3390/nano11092286

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8472151/
https://www.ncbi.nlm.nih.gov/pubmed/34578602
http://dx.doi.org/10.3390/nano11092286

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