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Low-Power Scan Correlation-Aware Scan Cluster Reordering for Wireless Sensor Networks
Cryptographic circuits generally are used for applications of wireless sensor networks to ensure security and must be tested in a manufacturing process to guarantee their quality. Therefore, a scan architecture is widely used for testing the circuits in the manufacturing test to improve testability....
Autores principales: | Lee, Sangjun, Cho, Kyunghwan, Kim, Jihye, Park, Jongho, Lee, Inhwan, Kang, Sungho |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
MDPI
2021
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8472869/ https://www.ncbi.nlm.nih.gov/pubmed/34577317 http://dx.doi.org/10.3390/s21186111 |
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