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Critical current fluctuations in graphene Josephson junctions
We have studied 1/f noise in critical current [Formula: see text] in h-BN encapsulated monolayer graphene contacted by NbTiN electrodes. The sample is close to diffusive limit and the switching supercurrent with hysteresis at Dirac point amounts to [Formula: see text] nA. The low frequency noise in...
Autores principales: | , , , , , , , , , , |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
Nature Publishing Group UK
2021
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8494814/ https://www.ncbi.nlm.nih.gov/pubmed/34615964 http://dx.doi.org/10.1038/s41598-021-99398-3 |
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author | Haque, Mohammad T. Will, Marco Tomi, Matti Pandey, Preeti Kumar, Manohar Schmidt, Felix Watanabe, Kenji Taniguchi, Takashi Danneau, Romain Steele, Gary Hakonen, Pertti |
author_facet | Haque, Mohammad T. Will, Marco Tomi, Matti Pandey, Preeti Kumar, Manohar Schmidt, Felix Watanabe, Kenji Taniguchi, Takashi Danneau, Romain Steele, Gary Hakonen, Pertti |
author_sort | Haque, Mohammad T. |
collection | PubMed |
description | We have studied 1/f noise in critical current [Formula: see text] in h-BN encapsulated monolayer graphene contacted by NbTiN electrodes. The sample is close to diffusive limit and the switching supercurrent with hysteresis at Dirac point amounts to [Formula: see text] nA. The low frequency noise in the superconducting state is measured by tracking the variation in magnitude and phase of a reflection carrier signal [Formula: see text] at 600–650 MHz. We find 1/f critical current fluctuations on the order of [Formula: see text] per unit band at 1 Hz. The noise power spectrum of critical current fluctuations [Formula: see text] measured near the Dirac point at large, sub-critical rf-carrier amplitudes obeys the law [Formula: see text] where [Formula: see text] and [Formula: see text] at [Formula: see text] Hz. Our results point towards significant fluctuations in [Formula: see text] originating from variation of the proximity induced gap in the graphene junction. |
format | Online Article Text |
id | pubmed-8494814 |
institution | National Center for Biotechnology Information |
language | English |
publishDate | 2021 |
publisher | Nature Publishing Group UK |
record_format | MEDLINE/PubMed |
spelling | pubmed-84948142021-10-08 Critical current fluctuations in graphene Josephson junctions Haque, Mohammad T. Will, Marco Tomi, Matti Pandey, Preeti Kumar, Manohar Schmidt, Felix Watanabe, Kenji Taniguchi, Takashi Danneau, Romain Steele, Gary Hakonen, Pertti Sci Rep Article We have studied 1/f noise in critical current [Formula: see text] in h-BN encapsulated monolayer graphene contacted by NbTiN electrodes. The sample is close to diffusive limit and the switching supercurrent with hysteresis at Dirac point amounts to [Formula: see text] nA. The low frequency noise in the superconducting state is measured by tracking the variation in magnitude and phase of a reflection carrier signal [Formula: see text] at 600–650 MHz. We find 1/f critical current fluctuations on the order of [Formula: see text] per unit band at 1 Hz. The noise power spectrum of critical current fluctuations [Formula: see text] measured near the Dirac point at large, sub-critical rf-carrier amplitudes obeys the law [Formula: see text] where [Formula: see text] and [Formula: see text] at [Formula: see text] Hz. Our results point towards significant fluctuations in [Formula: see text] originating from variation of the proximity induced gap in the graphene junction. Nature Publishing Group UK 2021-10-06 /pmc/articles/PMC8494814/ /pubmed/34615964 http://dx.doi.org/10.1038/s41598-021-99398-3 Text en © The Author(s) 2021 https://creativecommons.org/licenses/by/4.0/Open AccessThis article is licensed under a Creative Commons Attribution 4.0 International License, which permits use, sharing, adaptation, distribution and reproduction in any medium or format, as long as you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons licence, and indicate if changes were made. The images or other third party material in this article are included in the article's Creative Commons licence, unless indicated otherwise in a credit line to the material. If material is not included in the article's Creative Commons licence and your intended use is not permitted by statutory regulation or exceeds the permitted use, you will need to obtain permission directly from the copyright holder. To view a copy of this licence, visit http://creativecommons.org/licenses/by/4.0/ (https://creativecommons.org/licenses/by/4.0/) . |
spellingShingle | Article Haque, Mohammad T. Will, Marco Tomi, Matti Pandey, Preeti Kumar, Manohar Schmidt, Felix Watanabe, Kenji Taniguchi, Takashi Danneau, Romain Steele, Gary Hakonen, Pertti Critical current fluctuations in graphene Josephson junctions |
title | Critical current fluctuations in graphene Josephson junctions |
title_full | Critical current fluctuations in graphene Josephson junctions |
title_fullStr | Critical current fluctuations in graphene Josephson junctions |
title_full_unstemmed | Critical current fluctuations in graphene Josephson junctions |
title_short | Critical current fluctuations in graphene Josephson junctions |
title_sort | critical current fluctuations in graphene josephson junctions |
topic | Article |
url | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8494814/ https://www.ncbi.nlm.nih.gov/pubmed/34615964 http://dx.doi.org/10.1038/s41598-021-99398-3 |
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