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Numerical Study of Joule Heating Effects on Microfluidics Device Reliability in Electrode Based Devices
In electrode-based microfluidic devices, micro channels having narrow cross sections generate undesirable temperature inside the microfluidic device causing strong thermal distribution (joule heating) that eventually leads to device damage or cell loss. In this work, we investigate the effects of jo...
Autores principales: | , , , , , |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
MDPI
2021
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8510067/ https://www.ncbi.nlm.nih.gov/pubmed/34640216 http://dx.doi.org/10.3390/ma14195819 |
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author | Yousuff, Caffiyar Mohammed Tirth, Vineet Zackria Ansar Babu Irshad, Mohamed Irshad, Kashif Algahtani, Ali Islam, Saiful |
author_facet | Yousuff, Caffiyar Mohammed Tirth, Vineet Zackria Ansar Babu Irshad, Mohamed Irshad, Kashif Algahtani, Ali Islam, Saiful |
author_sort | Yousuff, Caffiyar Mohammed |
collection | PubMed |
description | In electrode-based microfluidic devices, micro channels having narrow cross sections generate undesirable temperature inside the microfluidic device causing strong thermal distribution (joule heating) that eventually leads to device damage or cell loss. In this work, we investigate the effects of joule heating due to different electrode configuration and found that, electrodes with triangular arrangements produce less heating effect even at applied potential of 30 V, without compromising the performance of the device and separation efficiency. However, certain electrode materials have low thermal gradients but erode the channel quickly thereby affecting the reliability of the device. Our simulation also predicts optimal medium conductivity (10 mS/m with 10 V) for cells to survive inside the channel until they are selectively isolated into the collection outlet. Our investigations will aid the researchers in the designing of efficient and reliable microfluidic devices to overcome joule heating inside the microchannels. |
format | Online Article Text |
id | pubmed-8510067 |
institution | National Center for Biotechnology Information |
language | English |
publishDate | 2021 |
publisher | MDPI |
record_format | MEDLINE/PubMed |
spelling | pubmed-85100672021-10-13 Numerical Study of Joule Heating Effects on Microfluidics Device Reliability in Electrode Based Devices Yousuff, Caffiyar Mohammed Tirth, Vineet Zackria Ansar Babu Irshad, Mohamed Irshad, Kashif Algahtani, Ali Islam, Saiful Materials (Basel) Article In electrode-based microfluidic devices, micro channels having narrow cross sections generate undesirable temperature inside the microfluidic device causing strong thermal distribution (joule heating) that eventually leads to device damage or cell loss. In this work, we investigate the effects of joule heating due to different electrode configuration and found that, electrodes with triangular arrangements produce less heating effect even at applied potential of 30 V, without compromising the performance of the device and separation efficiency. However, certain electrode materials have low thermal gradients but erode the channel quickly thereby affecting the reliability of the device. Our simulation also predicts optimal medium conductivity (10 mS/m with 10 V) for cells to survive inside the channel until they are selectively isolated into the collection outlet. Our investigations will aid the researchers in the designing of efficient and reliable microfluidic devices to overcome joule heating inside the microchannels. MDPI 2021-10-05 /pmc/articles/PMC8510067/ /pubmed/34640216 http://dx.doi.org/10.3390/ma14195819 Text en © 2021 by the authors. https://creativecommons.org/licenses/by/4.0/Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (https://creativecommons.org/licenses/by/4.0/). |
spellingShingle | Article Yousuff, Caffiyar Mohammed Tirth, Vineet Zackria Ansar Babu Irshad, Mohamed Irshad, Kashif Algahtani, Ali Islam, Saiful Numerical Study of Joule Heating Effects on Microfluidics Device Reliability in Electrode Based Devices |
title | Numerical Study of Joule Heating Effects on Microfluidics Device Reliability in Electrode Based Devices |
title_full | Numerical Study of Joule Heating Effects on Microfluidics Device Reliability in Electrode Based Devices |
title_fullStr | Numerical Study of Joule Heating Effects on Microfluidics Device Reliability in Electrode Based Devices |
title_full_unstemmed | Numerical Study of Joule Heating Effects on Microfluidics Device Reliability in Electrode Based Devices |
title_short | Numerical Study of Joule Heating Effects on Microfluidics Device Reliability in Electrode Based Devices |
title_sort | numerical study of joule heating effects on microfluidics device reliability in electrode based devices |
topic | Article |
url | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8510067/ https://www.ncbi.nlm.nih.gov/pubmed/34640216 http://dx.doi.org/10.3390/ma14195819 |
work_keys_str_mv | AT yousuffcaffiyarmohammed numericalstudyofjouleheatingeffectsonmicrofluidicsdevicereliabilityinelectrodebaseddevices AT tirthvineet numericalstudyofjouleheatingeffectsonmicrofluidicsdevicereliabilityinelectrodebaseddevices AT zackriaansarbabuirshadmohamed numericalstudyofjouleheatingeffectsonmicrofluidicsdevicereliabilityinelectrodebaseddevices AT irshadkashif numericalstudyofjouleheatingeffectsonmicrofluidicsdevicereliabilityinelectrodebaseddevices AT algahtaniali numericalstudyofjouleheatingeffectsonmicrofluidicsdevicereliabilityinelectrodebaseddevices AT islamsaiful numericalstudyofjouleheatingeffectsonmicrofluidicsdevicereliabilityinelectrodebaseddevices |