Controlled growth of a single carbon nanotube on an AFM probe

Carbon nanotubes (CNTs) can be used as atomic force microscopy (AFM) tips for high-resolution scanning due to their small diameter, high aspect ratio and outstanding wear resistance. However, previous approaches for fabricating CNT probes are complex and poorly controlled. In this paper, we introduc...

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Autores principales: Cheng, Biyao, Yang, Shuming, Li, Wei, Li, Shi, Shafique, Shareen, Wu, Dong, Ji, Shengyun, Sun, Yu, Jiang, Zhuangde
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group UK 2021
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8519951/
https://www.ncbi.nlm.nih.gov/pubmed/34721888
http://dx.doi.org/10.1038/s41378-021-00310-w
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author Cheng, Biyao
Yang, Shuming
Li, Wei
Li, Shi
Shafique, Shareen
Wu, Dong
Ji, Shengyun
Sun, Yu
Jiang, Zhuangde
author_facet Cheng, Biyao
Yang, Shuming
Li, Wei
Li, Shi
Shafique, Shareen
Wu, Dong
Ji, Shengyun
Sun, Yu
Jiang, Zhuangde
author_sort Cheng, Biyao
collection PubMed
description Carbon nanotubes (CNTs) can be used as atomic force microscopy (AFM) tips for high-resolution scanning due to their small diameter, high aspect ratio and outstanding wear resistance. However, previous approaches for fabricating CNT probes are complex and poorly controlled. In this paper, we introduce a simple method to selectively fabricate a single CNT on an AFM tip by controlling the trigger threshold to adjust the amount of growth solution attached to the tip. The yield rate is over 93%. The resulting CNT probes are suitable in length, without the need for a subsequent cutting process. We used the CNT probe to scan the complex nanostructure with a high aspect ratio, thereby solving the long-lasting problem of mapping complex nanostructures.
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spelling pubmed-85199512021-10-29 Controlled growth of a single carbon nanotube on an AFM probe Cheng, Biyao Yang, Shuming Li, Wei Li, Shi Shafique, Shareen Wu, Dong Ji, Shengyun Sun, Yu Jiang, Zhuangde Microsyst Nanoeng Article Carbon nanotubes (CNTs) can be used as atomic force microscopy (AFM) tips for high-resolution scanning due to their small diameter, high aspect ratio and outstanding wear resistance. However, previous approaches for fabricating CNT probes are complex and poorly controlled. In this paper, we introduce a simple method to selectively fabricate a single CNT on an AFM tip by controlling the trigger threshold to adjust the amount of growth solution attached to the tip. The yield rate is over 93%. The resulting CNT probes are suitable in length, without the need for a subsequent cutting process. We used the CNT probe to scan the complex nanostructure with a high aspect ratio, thereby solving the long-lasting problem of mapping complex nanostructures. Nature Publishing Group UK 2021-10-15 /pmc/articles/PMC8519951/ /pubmed/34721888 http://dx.doi.org/10.1038/s41378-021-00310-w Text en © The Author(s) 2021 https://creativecommons.org/licenses/by/4.0/Open Access This article is licensed under a Creative Commons Attribution 4.0 International License, which permits use, sharing, adaptation, distribution and reproduction in any medium or format, as long as you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons license, and indicate if changes were made. The images or other third party material in this article are included in the article’s Creative Commons license, unless indicated otherwise in a credit line to the material. If material is not included in the article’s Creative Commons license and your intended use is not permitted by statutory regulation or exceeds the permitted use, you will need to obtain permission directly from the copyright holder. To view a copy of this license, visit http://creativecommons.org/licenses/by/4.0/ (https://creativecommons.org/licenses/by/4.0/) .
spellingShingle Article
Cheng, Biyao
Yang, Shuming
Li, Wei
Li, Shi
Shafique, Shareen
Wu, Dong
Ji, Shengyun
Sun, Yu
Jiang, Zhuangde
Controlled growth of a single carbon nanotube on an AFM probe
title Controlled growth of a single carbon nanotube on an AFM probe
title_full Controlled growth of a single carbon nanotube on an AFM probe
title_fullStr Controlled growth of a single carbon nanotube on an AFM probe
title_full_unstemmed Controlled growth of a single carbon nanotube on an AFM probe
title_short Controlled growth of a single carbon nanotube on an AFM probe
title_sort controlled growth of a single carbon nanotube on an afm probe
topic Article
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8519951/
https://www.ncbi.nlm.nih.gov/pubmed/34721888
http://dx.doi.org/10.1038/s41378-021-00310-w
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