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Modeling of Statistical Variation Effects on DRAM Sense Amplifier Offset Voltage

With the downscaling in device sizes, process-induced parameter variation has emerged as one of the most serious problems. In particular, the parameter fluctuation of the dynamic random access memory (DRAM) sense amplifiers causes an offset voltage, leading to sensing failure. Previous studies indic...

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Detalles Bibliográficos
Autores principales:	Koo, Kyung Min, Chung, Woo Young, Lee, Sang Yi, Yoon, Gyu Han, Choi, Woo Young
Formato:	Online Artículo Texto
Lenguaje:	English
Publicado:	MDPI 2021
Materias:	Article
Acceso en línea:	https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8537535/ https://www.ncbi.nlm.nih.gov/pubmed/34683196 http://dx.doi.org/10.3390/mi12101145

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