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Macro-Modeling for N-Type Feedback Field-Effect Transistor for Circuit Simulation
In this study, we propose an improved macro-model of an N-type feedback field-effect transistor (NFBFET) and compare it with a previous macro-model for circuit simulation. The macro-model of the NFBFET is configured into two parts. One is a charge integrator circuit and the other is a current genera...
Autores principales: | , |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
MDPI
2021
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8539088/ https://www.ncbi.nlm.nih.gov/pubmed/34683223 http://dx.doi.org/10.3390/mi12101174 |
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author | Oh, Jong Hyeok Yu, Yun Seop |
author_facet | Oh, Jong Hyeok Yu, Yun Seop |
author_sort | Oh, Jong Hyeok |
collection | PubMed |
description | In this study, we propose an improved macro-model of an N-type feedback field-effect transistor (NFBFET) and compare it with a previous macro-model for circuit simulation. The macro-model of the NFBFET is configured into two parts. One is a charge integrator circuit and the other is a current generator circuit. The charge integrator circuit consisted of one N-type metal-oxide-semiconductor field-effect transistor (NMOSFET), one capacitor, and one resistor. This circuit implements the charging characteristics of NFBFET, which occur in the channel region. For the previous model, the current generator circuit consisted of one ideal switch and one resistor. The previous current generator circuit could implement I(DS)-V(GS) characteristics but could not accurately implement I(DS)-V(DS) characteristics. To solve this problem, we connected a physics-based diode model with an ideal switch in series to the current generator circuit. The parameters of the NMOSFET and diode used in this proposed model were fitted from TCAD data of the NFBFET, divided into two parts. The proposed model implements not only the I(DS)-V(GS) characteristics but also the I(DS)-V(DS) characteristics. A hybrid inverter and an integrate and fire (I&F) circuit for a spiking neural network, which consisted of NMOSFETs and an NFBFET, were simulated using the circuit simulator to verify a validation of the proposed NFBFET macro-model. |
format | Online Article Text |
id | pubmed-8539088 |
institution | National Center for Biotechnology Information |
language | English |
publishDate | 2021 |
publisher | MDPI |
record_format | MEDLINE/PubMed |
spelling | pubmed-85390882021-10-24 Macro-Modeling for N-Type Feedback Field-Effect Transistor for Circuit Simulation Oh, Jong Hyeok Yu, Yun Seop Micromachines (Basel) Article In this study, we propose an improved macro-model of an N-type feedback field-effect transistor (NFBFET) and compare it with a previous macro-model for circuit simulation. The macro-model of the NFBFET is configured into two parts. One is a charge integrator circuit and the other is a current generator circuit. The charge integrator circuit consisted of one N-type metal-oxide-semiconductor field-effect transistor (NMOSFET), one capacitor, and one resistor. This circuit implements the charging characteristics of NFBFET, which occur in the channel region. For the previous model, the current generator circuit consisted of one ideal switch and one resistor. The previous current generator circuit could implement I(DS)-V(GS) characteristics but could not accurately implement I(DS)-V(DS) characteristics. To solve this problem, we connected a physics-based diode model with an ideal switch in series to the current generator circuit. The parameters of the NMOSFET and diode used in this proposed model were fitted from TCAD data of the NFBFET, divided into two parts. The proposed model implements not only the I(DS)-V(GS) characteristics but also the I(DS)-V(DS) characteristics. A hybrid inverter and an integrate and fire (I&F) circuit for a spiking neural network, which consisted of NMOSFETs and an NFBFET, were simulated using the circuit simulator to verify a validation of the proposed NFBFET macro-model. MDPI 2021-09-29 /pmc/articles/PMC8539088/ /pubmed/34683223 http://dx.doi.org/10.3390/mi12101174 Text en © 2021 by the authors. https://creativecommons.org/licenses/by/4.0/Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (https://creativecommons.org/licenses/by/4.0/). |
spellingShingle | Article Oh, Jong Hyeok Yu, Yun Seop Macro-Modeling for N-Type Feedback Field-Effect Transistor for Circuit Simulation |
title | Macro-Modeling for N-Type Feedback Field-Effect Transistor for Circuit Simulation |
title_full | Macro-Modeling for N-Type Feedback Field-Effect Transistor for Circuit Simulation |
title_fullStr | Macro-Modeling for N-Type Feedback Field-Effect Transistor for Circuit Simulation |
title_full_unstemmed | Macro-Modeling for N-Type Feedback Field-Effect Transistor for Circuit Simulation |
title_short | Macro-Modeling for N-Type Feedback Field-Effect Transistor for Circuit Simulation |
title_sort | macro-modeling for n-type feedback field-effect transistor for circuit simulation |
topic | Article |
url | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8539088/ https://www.ncbi.nlm.nih.gov/pubmed/34683223 http://dx.doi.org/10.3390/mi12101174 |
work_keys_str_mv | AT ohjonghyeok macromodelingforntypefeedbackfieldeffecttransistorforcircuitsimulation AT yuyunseop macromodelingforntypefeedbackfieldeffecttransistorforcircuitsimulation |