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Statistically Representative Metrology of Nanoparticles via Unsupervised Machine Learning of TEM Images

The morphology of nanoparticles governs their properties for a range of important applications. Thus, the ability to statistically correlate this key particle performance parameter is paramount in achieving accurate control of nanoparticle properties. Among several effective techniques for morpholog...

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Detalles Bibliográficos
Autores principales:	Wen, Haotian, Luna-Romera, José María, Riquelme, José C., Dwyer, Christian, Chang, Shery L. Y.
Formato:	Online Artículo Texto
Lenguaje:	English
Publicado:	MDPI 2021
Materias:	Article
Acceso en línea:	https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8539342/ https://www.ncbi.nlm.nih.gov/pubmed/34685147 http://dx.doi.org/10.3390/nano11102706

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