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Impact Ionization Induced by Terahertz Radiation in HgTe Quantum Wells of Critical Thickness

We report on the observation of terahertz (THz) radiation induced band-to-band impact ionization in HgTe quantum well (QW) structures of critical thickness, which are characterized by a nearly linear energy dispersion. The THz electric field drives the carriers initializing electron-hole pair genera...

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Detalles Bibliográficos
Autores principales: Hubmann, S., Budkin, G.V., Urban, M., Bel’kov, V.V., Dmitriev, A.P., Ziegler, J., Kozlov, D.A., Mikhailov, N.N., Dvoretsky, S.A., Kvon, Z.D., Weiss, D., Ganichev, S.D.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Springer US 2020
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8550783/
https://www.ncbi.nlm.nih.gov/pubmed/34721704
http://dx.doi.org/10.1007/s10762-020-00690-6
Descripción
Sumario:We report on the observation of terahertz (THz) radiation induced band-to-band impact ionization in HgTe quantum well (QW) structures of critical thickness, which are characterized by a nearly linear energy dispersion. The THz electric field drives the carriers initializing electron-hole pair generation. The carrier multiplication is observed for photon energies less than the energy gap under the condition that the product of the radiation angular frequency ω and momentum relaxation time τ(l) larger than unity. In this case, the charge carriers acquire high energies solely because of collisions in the presence of a high-frequency electric field. The developed microscopic theory shows that the probability of the light-induced impact ionization is proportional to [Formula: see text] , with the radiation electric field amplitude E and the characteristic field parameter E(0). As observed in experiment, it exhibits a strong frequency dependence for ωτ ≫ 1 characterized by the characteristic field E(0) linearly increasing with the radiation frequency ω.