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Galvanic corrosion inhibition from aspect of bonding orbital theory in Cu/Ru barrier CMP
In this report, the galvanic corrosion inhibition between Cu and Ru metal films is studied, based on bonding orbital theory, using pyridinecarboxylic acid groups which show different affinities depending on the electron configuration of each metal resulting from a π-backbonding. The sp(2) carbon ato...
Autores principales: | , , , , , , , , |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
Nature Publishing Group UK
2021
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8551296/ https://www.ncbi.nlm.nih.gov/pubmed/34707193 http://dx.doi.org/10.1038/s41598-021-00689-6 |
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author | Lee, Kangchun Sun, Seho Lee, Ganggyu Yoon, Gyeonghui Kim, Donghyeok Hwang, Junha Jeong, Hojin Song, Taeseup Paik, Ungyu |
author_facet | Lee, Kangchun Sun, Seho Lee, Ganggyu Yoon, Gyeonghui Kim, Donghyeok Hwang, Junha Jeong, Hojin Song, Taeseup Paik, Ungyu |
author_sort | Lee, Kangchun |
collection | PubMed |
description | In this report, the galvanic corrosion inhibition between Cu and Ru metal films is studied, based on bonding orbital theory, using pyridinecarboxylic acid groups which show different affinities depending on the electron configuration of each metal resulting from a π-backbonding. The sp(2) carbon atoms adjacent to nitrogen in the pyridine ring provide π-acceptor which forms a complex with filled d-orbital of native oxides on Cu and Ru metal film. The difference in the d-orbital electron density of each metal oxide leads to different π-backbonding strength, resulting in dense or sparse adsorption on native metal oxides. The dense adsorption layer is formed on native Cu oxide film due to the full-filled d-orbital electrons, which effectively suppresses anodic reaction in Cu film. On the other hand, only a sparse adsorption layer is formed on native Ru oxide due to its relatively weak affinity between partially filled d-orbital and pyridine groups. The adsorption behaviour is investigated through interfacial interaction analysis and electrochemical interaction evaluation. Based on this finding, the galvanic corrosion behaviour between Cu and Ru during chemical mechanical planarization (CMP) processing has been controlled. |
format | Online Article Text |
id | pubmed-8551296 |
institution | National Center for Biotechnology Information |
language | English |
publishDate | 2021 |
publisher | Nature Publishing Group UK |
record_format | MEDLINE/PubMed |
spelling | pubmed-85512962021-11-01 Galvanic corrosion inhibition from aspect of bonding orbital theory in Cu/Ru barrier CMP Lee, Kangchun Sun, Seho Lee, Ganggyu Yoon, Gyeonghui Kim, Donghyeok Hwang, Junha Jeong, Hojin Song, Taeseup Paik, Ungyu Sci Rep Article In this report, the galvanic corrosion inhibition between Cu and Ru metal films is studied, based on bonding orbital theory, using pyridinecarboxylic acid groups which show different affinities depending on the electron configuration of each metal resulting from a π-backbonding. The sp(2) carbon atoms adjacent to nitrogen in the pyridine ring provide π-acceptor which forms a complex with filled d-orbital of native oxides on Cu and Ru metal film. The difference in the d-orbital electron density of each metal oxide leads to different π-backbonding strength, resulting in dense or sparse adsorption on native metal oxides. The dense adsorption layer is formed on native Cu oxide film due to the full-filled d-orbital electrons, which effectively suppresses anodic reaction in Cu film. On the other hand, only a sparse adsorption layer is formed on native Ru oxide due to its relatively weak affinity between partially filled d-orbital and pyridine groups. The adsorption behaviour is investigated through interfacial interaction analysis and electrochemical interaction evaluation. Based on this finding, the galvanic corrosion behaviour between Cu and Ru during chemical mechanical planarization (CMP) processing has been controlled. Nature Publishing Group UK 2021-10-27 /pmc/articles/PMC8551296/ /pubmed/34707193 http://dx.doi.org/10.1038/s41598-021-00689-6 Text en © The Author(s) 2021 https://creativecommons.org/licenses/by/4.0/Open Access This article is licensed under a Creative Commons Attribution 4.0 International License, which permits use, sharing, adaptation, distribution and reproduction in any medium or format, as long as you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons licence, and indicate if changes were made. The images or other third party material in this article are included in the article's Creative Commons licence, unless indicated otherwise in a credit line to the material. If material is not included in the article's Creative Commons licence and your intended use is not permitted by statutory regulation or exceeds the permitted use, you will need to obtain permission directly from the copyright holder. To view a copy of this licence, visit http://creativecommons.org/licenses/by/4.0/ (https://creativecommons.org/licenses/by/4.0/) . |
spellingShingle | Article Lee, Kangchun Sun, Seho Lee, Ganggyu Yoon, Gyeonghui Kim, Donghyeok Hwang, Junha Jeong, Hojin Song, Taeseup Paik, Ungyu Galvanic corrosion inhibition from aspect of bonding orbital theory in Cu/Ru barrier CMP |
title | Galvanic corrosion inhibition from aspect of bonding orbital theory in Cu/Ru barrier CMP |
title_full | Galvanic corrosion inhibition from aspect of bonding orbital theory in Cu/Ru barrier CMP |
title_fullStr | Galvanic corrosion inhibition from aspect of bonding orbital theory in Cu/Ru barrier CMP |
title_full_unstemmed | Galvanic corrosion inhibition from aspect of bonding orbital theory in Cu/Ru barrier CMP |
title_short | Galvanic corrosion inhibition from aspect of bonding orbital theory in Cu/Ru barrier CMP |
title_sort | galvanic corrosion inhibition from aspect of bonding orbital theory in cu/ru barrier cmp |
topic | Article |
url | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8551296/ https://www.ncbi.nlm.nih.gov/pubmed/34707193 http://dx.doi.org/10.1038/s41598-021-00689-6 |
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