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Predicting the Potential Applicability to Other Technical Fields Through the Linkage Between Backward and Forward Citations

This article is a modest attempt to shed some light on the question of linkages between backward and forward citations in technical fields posed by Trajtenberg et al. (1997). They found interesting similarities and high correlations between equivalent measures looking forward and backward. They also...

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Autor principal: Hirose, Masayuki
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Frontiers Media S.A. 2021
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8551672/
https://www.ncbi.nlm.nih.gov/pubmed/34723068
http://dx.doi.org/10.3389/frma.2021.736687
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author Hirose, Masayuki
author_facet Hirose, Masayuki
author_sort Hirose, Masayuki
collection PubMed
description This article is a modest attempt to shed some light on the question of linkages between backward and forward citations in technical fields posed by Trajtenberg et al. (1997). They found interesting similarities and high correlations between equivalent measures looking forward and backward. They also implied the linkage between distant backward and distant forward citations. There are several questions to be posed in applying their insights to Japanese patent applications, however, due to the differences in the patent classification system and the subject of citation, i.e., citations by the applicant or examiner, between the US and Japan. In addition, and most importantly, the possibility that subsequent classifications may match, even if the first classification is different, is unavoidable with existing measurement methods of technical distance. In order to investigate these research questions, the author proposes a new measurement method for the technological proximity between examiner’s citations and their originating patents using IPC-based patent classifications. Using such a proposed method, the author created two hypotheses and tested them for about 14,000 examined patent applications filed in 2008 with the JPO. As a result of testing Hypothesis I, the author confirmed that Trajtenberg et al.’s insights can be applied to Japanese patent applications using citations by the examiners and IPC-based patent classifications. In other words, it was confirmed that patent applications citing backward citations categorized in a technical field distant from the invention are more likely to be cited by forward citations categorized in a technical field distant from the invention. As a result of the verification of Hypothesis Ⅱ, it was further confirmed in some technical fields that the backward citations categorized in a technical field distant from the invention are more likely to be in the same technical field as the forward citations categorized in a technical field distant from the invention. The author believes that these verified results indicate the possibilities of using backward citations as a starting point from which we can find patent applications for inventions at an early stage with potential applicability to other technical fields.
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spelling pubmed-85516722021-10-29 Predicting the Potential Applicability to Other Technical Fields Through the Linkage Between Backward and Forward Citations Hirose, Masayuki Front Res Metr Anal Research Metrics and Analytics This article is a modest attempt to shed some light on the question of linkages between backward and forward citations in technical fields posed by Trajtenberg et al. (1997). They found interesting similarities and high correlations between equivalent measures looking forward and backward. They also implied the linkage between distant backward and distant forward citations. There are several questions to be posed in applying their insights to Japanese patent applications, however, due to the differences in the patent classification system and the subject of citation, i.e., citations by the applicant or examiner, between the US and Japan. In addition, and most importantly, the possibility that subsequent classifications may match, even if the first classification is different, is unavoidable with existing measurement methods of technical distance. In order to investigate these research questions, the author proposes a new measurement method for the technological proximity between examiner’s citations and their originating patents using IPC-based patent classifications. Using such a proposed method, the author created two hypotheses and tested them for about 14,000 examined patent applications filed in 2008 with the JPO. As a result of testing Hypothesis I, the author confirmed that Trajtenberg et al.’s insights can be applied to Japanese patent applications using citations by the examiners and IPC-based patent classifications. In other words, it was confirmed that patent applications citing backward citations categorized in a technical field distant from the invention are more likely to be cited by forward citations categorized in a technical field distant from the invention. As a result of the verification of Hypothesis Ⅱ, it was further confirmed in some technical fields that the backward citations categorized in a technical field distant from the invention are more likely to be in the same technical field as the forward citations categorized in a technical field distant from the invention. The author believes that these verified results indicate the possibilities of using backward citations as a starting point from which we can find patent applications for inventions at an early stage with potential applicability to other technical fields. Frontiers Media S.A. 2021-10-14 /pmc/articles/PMC8551672/ /pubmed/34723068 http://dx.doi.org/10.3389/frma.2021.736687 Text en Copyright © 2021 Hirose. https://creativecommons.org/licenses/by/4.0/This is an open-access article distributed under the terms of the Creative Commons Attribution License (CC BY). The use, distribution or reproduction in other forums is permitted, provided the original author(s) and the copyright owner(s) are credited and that the original publication in this journal is cited, in accordance with accepted academic practice. No use, distribution or reproduction is permitted which does not comply with these terms.
spellingShingle Research Metrics and Analytics
Hirose, Masayuki
Predicting the Potential Applicability to Other Technical Fields Through the Linkage Between Backward and Forward Citations
title Predicting the Potential Applicability to Other Technical Fields Through the Linkage Between Backward and Forward Citations
title_full Predicting the Potential Applicability to Other Technical Fields Through the Linkage Between Backward and Forward Citations
title_fullStr Predicting the Potential Applicability to Other Technical Fields Through the Linkage Between Backward and Forward Citations
title_full_unstemmed Predicting the Potential Applicability to Other Technical Fields Through the Linkage Between Backward and Forward Citations
title_short Predicting the Potential Applicability to Other Technical Fields Through the Linkage Between Backward and Forward Citations
title_sort predicting the potential applicability to other technical fields through the linkage between backward and forward citations
topic Research Metrics and Analytics
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8551672/
https://www.ncbi.nlm.nih.gov/pubmed/34723068
http://dx.doi.org/10.3389/frma.2021.736687
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