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Negatively Charged In-Plane and Out-Of-Plane Domain Walls with Oxygen-Vacancy Agglomerations in a Ca-Doped Bismuth-Ferrite Thin Film
[Image: see text] The interaction of oxygen vacancies and ferroelectric domain walls is of great scientific interest because it leads to different domain-structure behaviors. Here, we use high-resolution scanning transmission electron microscopy to study the ferroelectric domain structure and oxygen...
Autores principales: | , , , , , , , |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
American Chemical Society
2021
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Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8552442/ https://www.ncbi.nlm.nih.gov/pubmed/34723187 http://dx.doi.org/10.1021/acsaelm.1c00638 |
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author | Haselmann, Ulrich Suyolcu, Y. Eren Wu, Ping-Chun Ivanov, Yurii P. Knez, Daniel van Aken, Peter A. Chu, Ying-Hao Zhang, Zaoli |
author_facet | Haselmann, Ulrich Suyolcu, Y. Eren Wu, Ping-Chun Ivanov, Yurii P. Knez, Daniel van Aken, Peter A. Chu, Ying-Hao Zhang, Zaoli |
author_sort | Haselmann, Ulrich |
collection | PubMed |
description | [Image: see text] The interaction of oxygen vacancies and ferroelectric domain walls is of great scientific interest because it leads to different domain-structure behaviors. Here, we use high-resolution scanning transmission electron microscopy to study the ferroelectric domain structure and oxygen-vacancy ordering in a compressively strained Bi(0.9)Ca(0.1)FeO(3−δ) thin film. It was found that atomic plates, in which agglomerated oxygen vacancies are ordered, appear without any periodicity between the plates in out-of-plane and in-plane orientation. The oxygen non-stoichiometry with δ ≈ 1 in FeO(2−δ) planes is identical in both orientations and shows no preference. Within the plates, the oxygen vacancies form 1D channels in a pseudocubic [010] direction with a high number of vacancies that alternate with oxygen columns with few vacancies. These plates of oxygen vacancies always coincide with charged domain walls in a tail-to-tail configuration. Defects such as ordered oxygen vacancies are thereby known to lead to a pinning effect of the ferroelectric domain walls (causing application-critical aspects, such as fatigue mechanisms and countering of retention failure) and to have a critical influence on the domain-wall conductivity. Thus, intentional oxygen vacancy defect engineering could be useful for the design of multiferroic devices with advanced functionality. |
format | Online Article Text |
id | pubmed-8552442 |
institution | National Center for Biotechnology Information |
language | English |
publishDate | 2021 |
publisher | American Chemical Society |
record_format | MEDLINE/PubMed |
spelling | pubmed-85524422021-10-29 Negatively Charged In-Plane and Out-Of-Plane Domain Walls with Oxygen-Vacancy Agglomerations in a Ca-Doped Bismuth-Ferrite Thin Film Haselmann, Ulrich Suyolcu, Y. Eren Wu, Ping-Chun Ivanov, Yurii P. Knez, Daniel van Aken, Peter A. Chu, Ying-Hao Zhang, Zaoli ACS Appl Electron Mater [Image: see text] The interaction of oxygen vacancies and ferroelectric domain walls is of great scientific interest because it leads to different domain-structure behaviors. Here, we use high-resolution scanning transmission electron microscopy to study the ferroelectric domain structure and oxygen-vacancy ordering in a compressively strained Bi(0.9)Ca(0.1)FeO(3−δ) thin film. It was found that atomic plates, in which agglomerated oxygen vacancies are ordered, appear without any periodicity between the plates in out-of-plane and in-plane orientation. The oxygen non-stoichiometry with δ ≈ 1 in FeO(2−δ) planes is identical in both orientations and shows no preference. Within the plates, the oxygen vacancies form 1D channels in a pseudocubic [010] direction with a high number of vacancies that alternate with oxygen columns with few vacancies. These plates of oxygen vacancies always coincide with charged domain walls in a tail-to-tail configuration. Defects such as ordered oxygen vacancies are thereby known to lead to a pinning effect of the ferroelectric domain walls (causing application-critical aspects, such as fatigue mechanisms and countering of retention failure) and to have a critical influence on the domain-wall conductivity. Thus, intentional oxygen vacancy defect engineering could be useful for the design of multiferroic devices with advanced functionality. American Chemical Society 2021-09-24 2021-10-26 /pmc/articles/PMC8552442/ /pubmed/34723187 http://dx.doi.org/10.1021/acsaelm.1c00638 Text en © 2021 The Authors. Published by American Chemical Society https://creativecommons.org/licenses/by/4.0/Permits the broadest form of re-use including for commercial purposes, provided that author attribution and integrity are maintained (https://creativecommons.org/licenses/by/4.0/). |
spellingShingle | Haselmann, Ulrich Suyolcu, Y. Eren Wu, Ping-Chun Ivanov, Yurii P. Knez, Daniel van Aken, Peter A. Chu, Ying-Hao Zhang, Zaoli Negatively Charged In-Plane and Out-Of-Plane Domain Walls with Oxygen-Vacancy Agglomerations in a Ca-Doped Bismuth-Ferrite Thin Film |
title | Negatively Charged In-Plane and Out-Of-Plane Domain
Walls with Oxygen-Vacancy Agglomerations in a Ca-Doped Bismuth-Ferrite
Thin Film |
title_full | Negatively Charged In-Plane and Out-Of-Plane Domain
Walls with Oxygen-Vacancy Agglomerations in a Ca-Doped Bismuth-Ferrite
Thin Film |
title_fullStr | Negatively Charged In-Plane and Out-Of-Plane Domain
Walls with Oxygen-Vacancy Agglomerations in a Ca-Doped Bismuth-Ferrite
Thin Film |
title_full_unstemmed | Negatively Charged In-Plane and Out-Of-Plane Domain
Walls with Oxygen-Vacancy Agglomerations in a Ca-Doped Bismuth-Ferrite
Thin Film |
title_short | Negatively Charged In-Plane and Out-Of-Plane Domain
Walls with Oxygen-Vacancy Agglomerations in a Ca-Doped Bismuth-Ferrite
Thin Film |
title_sort | negatively charged in-plane and out-of-plane domain
walls with oxygen-vacancy agglomerations in a ca-doped bismuth-ferrite
thin film |
url | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8552442/ https://www.ncbi.nlm.nih.gov/pubmed/34723187 http://dx.doi.org/10.1021/acsaelm.1c00638 |
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