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Comparison of EMC and CM methods for orienting diffraction images in single-particle imaging experiments
In single-particle imaging (SPI) experiments, diffraction patterns of identical particles are recorded. The particles are injected into the X-ray free-electron laser (XFEL) beam in random orientations. The crucial step of the data processing of SPI is finding the orientations of the recorded diffrac...
| Autores principales: | , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
International Union of Crystallography
2021
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| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8562656/ https://www.ncbi.nlm.nih.gov/pubmed/34804550 http://dx.doi.org/10.1107/S205225252100868X |