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Comparison of EMC and CM methods for orienting diffraction images in single-particle imaging experiments

In single-particle imaging (SPI) experiments, diffraction patterns of identical particles are recorded. The particles are injected into the X-ray free-electron laser (XFEL) beam in random orientations. The crucial step of the data processing of SPI is finding the orientations of the recorded diffrac...

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Detalles Bibliográficos
Autores principales: Tegze, Miklós, Bortel, Gábor
Formato: Online Artículo Texto
Lenguaje:English
Publicado: International Union of Crystallography 2021
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8562656/
https://www.ncbi.nlm.nih.gov/pubmed/34804550
http://dx.doi.org/10.1107/S205225252100868X

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