Pink-beam serial femtosecond crystallography for accurate structure-factor determination at an X-ray free-electron laser

Serial femtosecond crystallography (SFX) at X-ray free-electron lasers (XFELs) enables essentially radiation-damage-free macromolecular structure determination using microcrystals that are too small for synchrotron studies. However, SFX experiments often require large amounts of sample in order to c...

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Detalles Bibliográficos
Autores principales: Nass, Karol, Bacellar, Camila, Cirelli, Claudio, Dworkowski, Florian, Gevorkov, Yaroslav, James, Daniel, Johnson, Philip J. M., Kekilli, Demet, Knopp, Gregor, Martiel, Isabelle, Ozerov, Dmitry, Tolstikova, Alexandra, Vera, Laura, Weinert, Tobias, Yefanov, Oleksandr, Standfuss, Jörg, Reiche, Sven, Milne, Christopher J.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: International Union of Crystallography 2021
Materias:
Research Papers
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8562661/
https://www.ncbi.nlm.nih.gov/pubmed/34804544
http://dx.doi.org/10.1107/S2052252521008046

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