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Upper Lip Reconstruction Using Fujimori Gate Flap in an Electrical Burn Patient
The Fujimori gate flap has been known and used for reconstruction of defects resulting from oncologic surgery. In this case report, we describe how this flap was utilized in reconstructing the upper lip of a patient who experienced an electrical burn injury resulting in 70% tissue loss of the upper...
Autores principales: | , |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
Lippincott Williams & Wilkins
2021
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8563072/ https://www.ncbi.nlm.nih.gov/pubmed/34745794 http://dx.doi.org/10.1097/GOX.0000000000003900 |
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author | Poncio, Mar Aristeo G. Nable-Aguilera, Ma. Adela |
author_facet | Poncio, Mar Aristeo G. Nable-Aguilera, Ma. Adela |
author_sort | Poncio, Mar Aristeo G. |
collection | PubMed |
description | The Fujimori gate flap has been known and used for reconstruction of defects resulting from oncologic surgery. In this case report, we describe how this flap was utilized in reconstructing the upper lip of a patient who experienced an electrical burn injury resulting in 70% tissue loss of the upper lip with exposed alveolar bone. A 22-year-old man presented to our institution with near total full-thickness burn over the upper lip, deep partial thickness burns over left upper lid, and superficial partial thickness burns over both malar areas, anterior chest, and both legs. He underwent full-thickness skin grafting of the left upper lid and upper cutaneous lip. After 3 weeks, a unilateral gate flap was performed. The flap was elevated with care to preserve the right angular artery and the Stensen’s duct. The flap was rotated 90 degrees medially and was sutured to the contralateral orbicularis oris, gingivobuccal mucosa, and to the rest of the upper cutaneous lip. The patient was followed up at 6 months and 1 year postoperatively. The flap was able to restore oral competence and enabled the patient to speak and chew with no difficulty. Patients suffering from high-voltage electrical burns, especially involving the mouth, present a challenging case for surgeons for reconstruction. Here, the goals of the reconstruction are to restore oral competence and ability to articulate, and still provide good appearance. A feasible and aesthetically acceptable flap providing good functional outcome is provided by the use of the unilateral Fujimori gate flap among patients suffering from high-voltage electrical burns of the oral cavity. |
format | Online Article Text |
id | pubmed-8563072 |
institution | National Center for Biotechnology Information |
language | English |
publishDate | 2021 |
publisher | Lippincott Williams & Wilkins |
record_format | MEDLINE/PubMed |
spelling | pubmed-85630722021-11-04 Upper Lip Reconstruction Using Fujimori Gate Flap in an Electrical Burn Patient Poncio, Mar Aristeo G. Nable-Aguilera, Ma. Adela Plast Reconstr Surg Glob Open Reconstructive The Fujimori gate flap has been known and used for reconstruction of defects resulting from oncologic surgery. In this case report, we describe how this flap was utilized in reconstructing the upper lip of a patient who experienced an electrical burn injury resulting in 70% tissue loss of the upper lip with exposed alveolar bone. A 22-year-old man presented to our institution with near total full-thickness burn over the upper lip, deep partial thickness burns over left upper lid, and superficial partial thickness burns over both malar areas, anterior chest, and both legs. He underwent full-thickness skin grafting of the left upper lid and upper cutaneous lip. After 3 weeks, a unilateral gate flap was performed. The flap was elevated with care to preserve the right angular artery and the Stensen’s duct. The flap was rotated 90 degrees medially and was sutured to the contralateral orbicularis oris, gingivobuccal mucosa, and to the rest of the upper cutaneous lip. The patient was followed up at 6 months and 1 year postoperatively. The flap was able to restore oral competence and enabled the patient to speak and chew with no difficulty. Patients suffering from high-voltage electrical burns, especially involving the mouth, present a challenging case for surgeons for reconstruction. Here, the goals of the reconstruction are to restore oral competence and ability to articulate, and still provide good appearance. A feasible and aesthetically acceptable flap providing good functional outcome is provided by the use of the unilateral Fujimori gate flap among patients suffering from high-voltage electrical burns of the oral cavity. Lippincott Williams & Wilkins 2021-11-02 /pmc/articles/PMC8563072/ /pubmed/34745794 http://dx.doi.org/10.1097/GOX.0000000000003900 Text en Copyright © 2021 The Authors. Published by Wolters Kluwer Health, Inc. on behalf of The American Society of Plastic Surgeons. https://creativecommons.org/licenses/by-nc-nd/4.0/This is an open-access article distributed under the terms of the Creative Commons Attribution-Non Commercial-No Derivatives License 4.0 (CCBY-NC-ND) (https://creativecommons.org/licenses/by-nc-nd/4.0/) , where it is permissible to download and share the work provided it is properly cited. The work cannot be changed in any way or used commercially without permission from the journal. |
spellingShingle | Reconstructive Poncio, Mar Aristeo G. Nable-Aguilera, Ma. Adela Upper Lip Reconstruction Using Fujimori Gate Flap in an Electrical Burn Patient |
title | Upper Lip Reconstruction Using Fujimori Gate Flap in an Electrical Burn Patient |
title_full | Upper Lip Reconstruction Using Fujimori Gate Flap in an Electrical Burn Patient |
title_fullStr | Upper Lip Reconstruction Using Fujimori Gate Flap in an Electrical Burn Patient |
title_full_unstemmed | Upper Lip Reconstruction Using Fujimori Gate Flap in an Electrical Burn Patient |
title_short | Upper Lip Reconstruction Using Fujimori Gate Flap in an Electrical Burn Patient |
title_sort | upper lip reconstruction using fujimori gate flap in an electrical burn patient |
topic | Reconstructive |
url | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8563072/ https://www.ncbi.nlm.nih.gov/pubmed/34745794 http://dx.doi.org/10.1097/GOX.0000000000003900 |
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