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Observation of high nonlinearity in Bi doped Bi(x)In(35-x)Se(65) thin films with annealing

The present work demonstrates the impact of thermal annealing on the structural, linear, and non-linear optical characteristics of thermally evaporated Bi(x)In(35-x)Se(65) (x = 0, 5, 10, 15 at%) thin films. The prominent crystalline phases have been developed for all annealed films at 450 °C whereas...

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Detalles Bibliográficos
Autores principales: Priyadarshini, P., Das, Subhashree, Alagarasan, D., Ganesan, R., Varadharajaperumal, S., Naik, Ramakanta
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group UK 2021
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8563738/
https://www.ncbi.nlm.nih.gov/pubmed/34728771
http://dx.doi.org/10.1038/s41598-021-01134-4
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author Priyadarshini, P.
Das, Subhashree
Alagarasan, D.
Ganesan, R.
Varadharajaperumal, S.
Naik, Ramakanta
author_facet Priyadarshini, P.
Das, Subhashree
Alagarasan, D.
Ganesan, R.
Varadharajaperumal, S.
Naik, Ramakanta
author_sort Priyadarshini, P.
collection PubMed
description The present work demonstrates the impact of thermal annealing on the structural, linear, and non-linear optical characteristics of thermally evaporated Bi(x)In(35-x)Se(65) (x = 0, 5, 10, 15 at%) thin films. The prominent crystalline phases have been developed for all annealed films at 450 °C whereas the films remain amorphous at 350 °C annealing. The XRD and Raman analysis showed the phase transformation of Bi-doped films and new Bi(2)Se(3) phases developed upon annealing at 450 °C. The phase transformation induced change increased the linear and nonlinear properties with great extent as seen from the UV–visible optical studies. The direct and indirect optical bandgaps decreased with annealing temperature and also with Bi % content due to the formation of surface dangling bonds near the crystallite sites. The static linear refractive index and high-frequency dielectric constants were increased with annealing. The third-order non-linear susceptibility and non-linear refractive index were found to be greatly influenced by annealing temperature and increased with bismuth content. The FESEM micrographs also showed the phase transformation and EDX analysis showed the composition. The results obtained from the materials showed the potentiality to be useful for photovoltaic and optoelectronic applications.
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spelling pubmed-85637382021-11-03 Observation of high nonlinearity in Bi doped Bi(x)In(35-x)Se(65) thin films with annealing Priyadarshini, P. Das, Subhashree Alagarasan, D. Ganesan, R. Varadharajaperumal, S. Naik, Ramakanta Sci Rep Article The present work demonstrates the impact of thermal annealing on the structural, linear, and non-linear optical characteristics of thermally evaporated Bi(x)In(35-x)Se(65) (x = 0, 5, 10, 15 at%) thin films. The prominent crystalline phases have been developed for all annealed films at 450 °C whereas the films remain amorphous at 350 °C annealing. The XRD and Raman analysis showed the phase transformation of Bi-doped films and new Bi(2)Se(3) phases developed upon annealing at 450 °C. The phase transformation induced change increased the linear and nonlinear properties with great extent as seen from the UV–visible optical studies. The direct and indirect optical bandgaps decreased with annealing temperature and also with Bi % content due to the formation of surface dangling bonds near the crystallite sites. The static linear refractive index and high-frequency dielectric constants were increased with annealing. The third-order non-linear susceptibility and non-linear refractive index were found to be greatly influenced by annealing temperature and increased with bismuth content. The FESEM micrographs also showed the phase transformation and EDX analysis showed the composition. The results obtained from the materials showed the potentiality to be useful for photovoltaic and optoelectronic applications. Nature Publishing Group UK 2021-11-02 /pmc/articles/PMC8563738/ /pubmed/34728771 http://dx.doi.org/10.1038/s41598-021-01134-4 Text en © The Author(s) 2021 https://creativecommons.org/licenses/by/4.0/Open Access This article is licensed under a Creative Commons Attribution 4.0 International License, which permits use, sharing, adaptation, distribution and reproduction in any medium or format, as long as you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons licence, and indicate if changes were made. The images or other third party material in this article are included in the article's Creative Commons licence, unless indicated otherwise in a credit line to the material. If material is not included in the article's Creative Commons licence and your intended use is not permitted by statutory regulation or exceeds the permitted use, you will need to obtain permission directly from the copyright holder. To view a copy of this licence, visit http://creativecommons.org/licenses/by/4.0/ (https://creativecommons.org/licenses/by/4.0/) .
spellingShingle Article
Priyadarshini, P.
Das, Subhashree
Alagarasan, D.
Ganesan, R.
Varadharajaperumal, S.
Naik, Ramakanta
Observation of high nonlinearity in Bi doped Bi(x)In(35-x)Se(65) thin films with annealing
title Observation of high nonlinearity in Bi doped Bi(x)In(35-x)Se(65) thin films with annealing
title_full Observation of high nonlinearity in Bi doped Bi(x)In(35-x)Se(65) thin films with annealing
title_fullStr Observation of high nonlinearity in Bi doped Bi(x)In(35-x)Se(65) thin films with annealing
title_full_unstemmed Observation of high nonlinearity in Bi doped Bi(x)In(35-x)Se(65) thin films with annealing
title_short Observation of high nonlinearity in Bi doped Bi(x)In(35-x)Se(65) thin films with annealing
title_sort observation of high nonlinearity in bi doped bi(x)in(35-x)se(65) thin films with annealing
topic Article
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8563738/
https://www.ncbi.nlm.nih.gov/pubmed/34728771
http://dx.doi.org/10.1038/s41598-021-01134-4
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