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Highly Reliable Method to Obtain a Correlation Coefficient Unaffected by the SEM Noise Component for Examining the Degree of Specimen Damage due to Electron Beam Irradiation
A correlation coefficient is often used as a measure of the strength of a linear relationship (i.e., the degree of similarity) between two sets of data in a variety of fields. However, in the field of scanning electron microscopy (SEM), it is frequently difficult to properly use the correlation coef...
| Autores principales: | , , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
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Hindawi
2021
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| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8608542/ https://www.ncbi.nlm.nih.gov/pubmed/34868448 http://dx.doi.org/10.1155/2021/2226577 |