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Deep learning approach for an interface structure analysis with a large statistical noise in neutron reflectometry
Neutron reflectometry (NR) allows us to probe into the structure of the surfaces and interfaces of various materials such as soft matters and magnetic thin films with a contrast mechanism dependent on isotopic and magnetic states. The neutron beam flux is relatively low compared to that of other sou...
Autores principales: | , , |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
Nature Publishing Group UK
2021
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8608885/ https://www.ncbi.nlm.nih.gov/pubmed/34811432 http://dx.doi.org/10.1038/s41598-021-02085-6 |
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author | Aoki, Hiroyuki Liu, Yuwei Yamashita, Takashi |
author_facet | Aoki, Hiroyuki Liu, Yuwei Yamashita, Takashi |
author_sort | Aoki, Hiroyuki |
collection | PubMed |
description | Neutron reflectometry (NR) allows us to probe into the structure of the surfaces and interfaces of various materials such as soft matters and magnetic thin films with a contrast mechanism dependent on isotopic and magnetic states. The neutron beam flux is relatively low compared to that of other sources such as synchrotron radiation; therefore, there has been a strong limitation in the time-resolved measurement and further advanced experiments such as surface imaging. This study aims at the development of a methodology to enable the structural analysis by the NR data with a large statistical error acquired in a short measurement time. The neural network-based method predicts the true NR profile from the data with a 20-fold lower signal compared to that obtained under the conventional measurement condition. This indicates that the acquisition time in the NR measurement can be reduced by more than one order of magnitude. The current method will help achieve remarkable improvement in temporally and spatially resolved NR methods to gain further insight into the surface and interfaces of materials. |
format | Online Article Text |
id | pubmed-8608885 |
institution | National Center for Biotechnology Information |
language | English |
publishDate | 2021 |
publisher | Nature Publishing Group UK |
record_format | MEDLINE/PubMed |
spelling | pubmed-86088852021-11-24 Deep learning approach for an interface structure analysis with a large statistical noise in neutron reflectometry Aoki, Hiroyuki Liu, Yuwei Yamashita, Takashi Sci Rep Article Neutron reflectometry (NR) allows us to probe into the structure of the surfaces and interfaces of various materials such as soft matters and magnetic thin films with a contrast mechanism dependent on isotopic and magnetic states. The neutron beam flux is relatively low compared to that of other sources such as synchrotron radiation; therefore, there has been a strong limitation in the time-resolved measurement and further advanced experiments such as surface imaging. This study aims at the development of a methodology to enable the structural analysis by the NR data with a large statistical error acquired in a short measurement time. The neural network-based method predicts the true NR profile from the data with a 20-fold lower signal compared to that obtained under the conventional measurement condition. This indicates that the acquisition time in the NR measurement can be reduced by more than one order of magnitude. The current method will help achieve remarkable improvement in temporally and spatially resolved NR methods to gain further insight into the surface and interfaces of materials. Nature Publishing Group UK 2021-11-22 /pmc/articles/PMC8608885/ /pubmed/34811432 http://dx.doi.org/10.1038/s41598-021-02085-6 Text en © The Author(s) 2021 https://creativecommons.org/licenses/by/4.0/Open AccessThis article is licensed under a Creative Commons Attribution 4.0 International License, which permits use, sharing, adaptation, distribution and reproduction in any medium or format, as long as you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons licence, and indicate if changes were made. The images or other third party material in this article are included in the article's Creative Commons licence, unless indicated otherwise in a credit line to the material. If material is not included in the article's Creative Commons licence and your intended use is not permitted by statutory regulation or exceeds the permitted use, you will need to obtain permission directly from the copyright holder. To view a copy of this licence, visit http://creativecommons.org/licenses/by/4.0/ (https://creativecommons.org/licenses/by/4.0/) . |
spellingShingle | Article Aoki, Hiroyuki Liu, Yuwei Yamashita, Takashi Deep learning approach for an interface structure analysis with a large statistical noise in neutron reflectometry |
title | Deep learning approach for an interface structure analysis with a large statistical noise in neutron reflectometry |
title_full | Deep learning approach for an interface structure analysis with a large statistical noise in neutron reflectometry |
title_fullStr | Deep learning approach for an interface structure analysis with a large statistical noise in neutron reflectometry |
title_full_unstemmed | Deep learning approach for an interface structure analysis with a large statistical noise in neutron reflectometry |
title_short | Deep learning approach for an interface structure analysis with a large statistical noise in neutron reflectometry |
title_sort | deep learning approach for an interface structure analysis with a large statistical noise in neutron reflectometry |
topic | Article |
url | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8608885/ https://www.ncbi.nlm.nih.gov/pubmed/34811432 http://dx.doi.org/10.1038/s41598-021-02085-6 |
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