High temporal-resolution scanning transmission electron microscopy using sparse-serpentine scan pathways

Scanning transmission electron microscopy (STEM) provides structural analysis with sub-angstrom resolution. But the pixel-by-pixel scanning process is a limiting factor in acquiring high-speed data. Different strategies have been implemented to increase scanning speeds while at the same time minimiz...

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Detalles Bibliográficos
Autores principales: Ortega, Eduardo, Nicholls, Daniel, Browning, Nigel D., de Jonge, Niels
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group UK 2021
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8608981/
https://www.ncbi.nlm.nih.gov/pubmed/34811427
http://dx.doi.org/10.1038/s41598-021-02052-1

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8608981/
https://www.ncbi.nlm.nih.gov/pubmed/34811427
http://dx.doi.org/10.1038/s41598-021-02052-1

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