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Two dynamic modes to streamline challenging atomic force microscopy measurements

The quality of topographic images obtained using atomic force microscopy strongly depends on the accuracy of the choice of scanning parameters. When using the most common scanning method – semicontact amplitude modulation (tapping) mode, the choice of scanning parameters is quite complicated, since...

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Detalles Bibliográficos
Autores principales: Temiryazev, Alexei G, Krayev, Andrey V, Temiryazeva, Marina P
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Beilstein-Institut 2021
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8609242/
https://www.ncbi.nlm.nih.gov/pubmed/34868799
http://dx.doi.org/10.3762/bjnano.12.90