Fast acquisition protocol for X-ray scattering tensor tomography

Microstructural information over an entire sample is important to understand the macroscopic behaviour of materials. X-ray scattering tensor tomography facilitates the investigation of the microstructural organisation in statistically large sample volumes. However, established acquisition protocols...

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Detalles Bibliográficos
Autores principales: Kim, Jisoo, Kagias, Matias, Marone, Federica, Shi, Zhitian, Stampanoni, Marco
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group UK 2021
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8629987/
https://www.ncbi.nlm.nih.gov/pubmed/34845280
http://dx.doi.org/10.1038/s41598-021-02467-w

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8629987/
https://www.ncbi.nlm.nih.gov/pubmed/34845280
http://dx.doi.org/10.1038/s41598-021-02467-w

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