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Cantilever signature of tip detachment during contact resonance AFM
Contact resonance atomic force microscopy, piezoresponse force microscopy, and electrochemical strain microscopy are atomic force microscopy modes in which the cantilever is held in contact with the sample at a constant average force while monitoring the cantilever motion under the influence of a sm...
Autores principales: | , , , , |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
Beilstein-Institut
2021
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8630435/ https://www.ncbi.nlm.nih.gov/pubmed/34900510 http://dx.doi.org/10.3762/bjnano.12.96 |
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author | Kalafut, Devin Wagner, Ryan Cadena, Maria Jose Bajaj, Anil Raman, Arvind |
author_facet | Kalafut, Devin Wagner, Ryan Cadena, Maria Jose Bajaj, Anil Raman, Arvind |
author_sort | Kalafut, Devin |
collection | PubMed |
description | Contact resonance atomic force microscopy, piezoresponse force microscopy, and electrochemical strain microscopy are atomic force microscopy modes in which the cantilever is held in contact with the sample at a constant average force while monitoring the cantilever motion under the influence of a small, superimposed vibrational signal. Though these modes depend on permanent contact, there is a lack of detailed analysis on how the cantilever motion evolves when this essential condition is violated. This is not an uncommon occurrence since higher operating amplitudes tend to yield better signal-to-noise ratio, so users may inadvertently reduce their experimental accuracy by inducing tip–sample detachment in an effort to improve their measurements. We shed light on this issue by deliberately pushing both our experimental equipment and numerical simulations to the point of tip–sample detachment to explore cantilever dynamics during a useful and observable threshold feature in the measured response. Numerical simulations of the analytical model allow for extended insight into cantilever dynamics such as full-length deflection and slope behavior, which can be challenging or unobtainable in a standard equipment configuration. With such tools, we are able to determine the cantilever motion during detachment and connect the qualitative and quantitative behavior to experimental features. |
format | Online Article Text |
id | pubmed-8630435 |
institution | National Center for Biotechnology Information |
language | English |
publishDate | 2021 |
publisher | Beilstein-Institut |
record_format | MEDLINE/PubMed |
spelling | pubmed-86304352021-12-09 Cantilever signature of tip detachment during contact resonance AFM Kalafut, Devin Wagner, Ryan Cadena, Maria Jose Bajaj, Anil Raman, Arvind Beilstein J Nanotechnol Full Research Paper Contact resonance atomic force microscopy, piezoresponse force microscopy, and electrochemical strain microscopy are atomic force microscopy modes in which the cantilever is held in contact with the sample at a constant average force while monitoring the cantilever motion under the influence of a small, superimposed vibrational signal. Though these modes depend on permanent contact, there is a lack of detailed analysis on how the cantilever motion evolves when this essential condition is violated. This is not an uncommon occurrence since higher operating amplitudes tend to yield better signal-to-noise ratio, so users may inadvertently reduce their experimental accuracy by inducing tip–sample detachment in an effort to improve their measurements. We shed light on this issue by deliberately pushing both our experimental equipment and numerical simulations to the point of tip–sample detachment to explore cantilever dynamics during a useful and observable threshold feature in the measured response. Numerical simulations of the analytical model allow for extended insight into cantilever dynamics such as full-length deflection and slope behavior, which can be challenging or unobtainable in a standard equipment configuration. With such tools, we are able to determine the cantilever motion during detachment and connect the qualitative and quantitative behavior to experimental features. Beilstein-Institut 2021-11-24 /pmc/articles/PMC8630435/ /pubmed/34900510 http://dx.doi.org/10.3762/bjnano.12.96 Text en Copyright © 2021, Kalafut et al. https://creativecommons.org/licenses/by/4.0/This is an open access article licensed under the terms of the Beilstein-Institut Open Access License Agreement (https://www.beilstein-journals.org/bjnano/terms/terms), which is identical to the Creative Commons Attribution 4.0 International License (https://creativecommons.org/licenses/by/4.0 (https://creativecommons.org/licenses/by/4.0/) ). The reuse of material under this license requires that the author(s), source and license are credited. Third-party material in this article could be subject to other licenses (typically indicated in the credit line), and in this case, users are required to obtain permission from the license holder to reuse the material. |
spellingShingle | Full Research Paper Kalafut, Devin Wagner, Ryan Cadena, Maria Jose Bajaj, Anil Raman, Arvind Cantilever signature of tip detachment during contact resonance AFM |
title | Cantilever signature of tip detachment during contact resonance AFM |
title_full | Cantilever signature of tip detachment during contact resonance AFM |
title_fullStr | Cantilever signature of tip detachment during contact resonance AFM |
title_full_unstemmed | Cantilever signature of tip detachment during contact resonance AFM |
title_short | Cantilever signature of tip detachment during contact resonance AFM |
title_sort | cantilever signature of tip detachment during contact resonance afm |
topic | Full Research Paper |
url | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8630435/ https://www.ncbi.nlm.nih.gov/pubmed/34900510 http://dx.doi.org/10.3762/bjnano.12.96 |
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