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Analysis of the Influence of the Breaking Radiation Magnetic Field of a 10 kV Intelligent Circuit Breaker on an Electronic Transformer

The development of the smart grid requires the distribution switch to not be limited to the original breaking function. More functional requirements lead to more complex switch structures, especially the intelligent processing unit on the secondary side. A technology called primary and secondary int...

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Detalles Bibliográficos
Autores principales: Lu, Wenchao, Duan, Jiandong, Cheng, Lin, Lu, Jiangping, Du, Xiaotong
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2021
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8659989/
https://www.ncbi.nlm.nih.gov/pubmed/34883804
http://dx.doi.org/10.3390/s21237800
_version_ 1784613094847152128
author Lu, Wenchao
Duan, Jiandong
Cheng, Lin
Lu, Jiangping
Du, Xiaotong
author_facet Lu, Wenchao
Duan, Jiandong
Cheng, Lin
Lu, Jiangping
Du, Xiaotong
author_sort Lu, Wenchao
collection PubMed
description The development of the smart grid requires the distribution switch to not be limited to the original breaking function. More functional requirements lead to more complex switch structures, especially the intelligent processing unit on the secondary side. A technology called primary and secondary integration optimizes the structure of the switch, which greatly increases the intelligence level of the switch, but also has disadvantages. The secondary intelligent unit is arranged close to the primary high-voltage electromagnetic environment, and the distribution switch is prone to failure due to electromagnetic interference. In order to explore the influence of electromagnetic interference on it, a transient electromagnetic interference simulation test platform was built for a 10 kV intelligent distribution switch based on the principle of spherical gap arc discharge, and the interference signal of the intelligent distribution switch was measured; the law of the spatial magnetic field near the electronic transformer is mainly studied in this paper. The shielding effectiveness of the distribution terminal of the switch was analyzed, and the interference of the power line of the sensor merging unit circuit board was calculated. The results show that the electronic transformer may have serious faults under continuous strong transient electromagnetic interference. The electromagnetic transient simulation test system studied in this paper can evaluate the anti strong electromagnetic interference ability of the electronic transformer.
format Online
Article
Text
id pubmed-8659989
institution National Center for Biotechnology Information
language English
publishDate 2021
publisher MDPI
record_format MEDLINE/PubMed
spelling pubmed-86599892021-12-10 Analysis of the Influence of the Breaking Radiation Magnetic Field of a 10 kV Intelligent Circuit Breaker on an Electronic Transformer Lu, Wenchao Duan, Jiandong Cheng, Lin Lu, Jiangping Du, Xiaotong Sensors (Basel) Article The development of the smart grid requires the distribution switch to not be limited to the original breaking function. More functional requirements lead to more complex switch structures, especially the intelligent processing unit on the secondary side. A technology called primary and secondary integration optimizes the structure of the switch, which greatly increases the intelligence level of the switch, but also has disadvantages. The secondary intelligent unit is arranged close to the primary high-voltage electromagnetic environment, and the distribution switch is prone to failure due to electromagnetic interference. In order to explore the influence of electromagnetic interference on it, a transient electromagnetic interference simulation test platform was built for a 10 kV intelligent distribution switch based on the principle of spherical gap arc discharge, and the interference signal of the intelligent distribution switch was measured; the law of the spatial magnetic field near the electronic transformer is mainly studied in this paper. The shielding effectiveness of the distribution terminal of the switch was analyzed, and the interference of the power line of the sensor merging unit circuit board was calculated. The results show that the electronic transformer may have serious faults under continuous strong transient electromagnetic interference. The electromagnetic transient simulation test system studied in this paper can evaluate the anti strong electromagnetic interference ability of the electronic transformer. MDPI 2021-11-24 /pmc/articles/PMC8659989/ /pubmed/34883804 http://dx.doi.org/10.3390/s21237800 Text en © 2021 by the authors. https://creativecommons.org/licenses/by/4.0/Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (https://creativecommons.org/licenses/by/4.0/).
spellingShingle Article
Lu, Wenchao
Duan, Jiandong
Cheng, Lin
Lu, Jiangping
Du, Xiaotong
Analysis of the Influence of the Breaking Radiation Magnetic Field of a 10 kV Intelligent Circuit Breaker on an Electronic Transformer
title Analysis of the Influence of the Breaking Radiation Magnetic Field of a 10 kV Intelligent Circuit Breaker on an Electronic Transformer
title_full Analysis of the Influence of the Breaking Radiation Magnetic Field of a 10 kV Intelligent Circuit Breaker on an Electronic Transformer
title_fullStr Analysis of the Influence of the Breaking Radiation Magnetic Field of a 10 kV Intelligent Circuit Breaker on an Electronic Transformer
title_full_unstemmed Analysis of the Influence of the Breaking Radiation Magnetic Field of a 10 kV Intelligent Circuit Breaker on an Electronic Transformer
title_short Analysis of the Influence of the Breaking Radiation Magnetic Field of a 10 kV Intelligent Circuit Breaker on an Electronic Transformer
title_sort analysis of the influence of the breaking radiation magnetic field of a 10 kv intelligent circuit breaker on an electronic transformer
topic Article
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8659989/
https://www.ncbi.nlm.nih.gov/pubmed/34883804
http://dx.doi.org/10.3390/s21237800
work_keys_str_mv AT luwenchao analysisoftheinfluenceofthebreakingradiationmagneticfieldofa10kvintelligentcircuitbreakeronanelectronictransformer
AT duanjiandong analysisoftheinfluenceofthebreakingradiationmagneticfieldofa10kvintelligentcircuitbreakeronanelectronictransformer
AT chenglin analysisoftheinfluenceofthebreakingradiationmagneticfieldofa10kvintelligentcircuitbreakeronanelectronictransformer
AT lujiangping analysisoftheinfluenceofthebreakingradiationmagneticfieldofa10kvintelligentcircuitbreakeronanelectronictransformer
AT duxiaotong analysisoftheinfluenceofthebreakingradiationmagneticfieldofa10kvintelligentcircuitbreakeronanelectronictransformer