Artifact removal in the contour areas of SAXS-CT images by Tikhonov-L1 minimization

Small-angle X-ray scattering (SAXS) coupled with computed tomography (CT), denoted SAXS-CT, has enabled the spatial distribution of the characteristic parameters (e.g. size, shape, surface, length) of nanoscale structures inside samples to be visualized. In this work, a new scheme with Tikhonov regu...

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Detalles Bibliográficos
Autores principales: Ogawa, Hiroki, Ono, Shunsuke, Watanabe, Yuki, Nishikawa, Yukihiro, Nishitsuji, Shotaro, Kabe, Taizo, Takenaka, Mikihito
Formato: Online Artículo Texto
Lenguaje:English
Publicado: International Union of Crystallography 2021
Materias:
Research Papers
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8662970/
https://www.ncbi.nlm.nih.gov/pubmed/34963766
http://dx.doi.org/10.1107/S1600576721011523
Descripción
Sumario:Small-angle X-ray scattering (SAXS) coupled with computed tomography (CT), denoted SAXS-CT, has enabled the spatial distribution of the characteristic parameters (e.g. size, shape, surface, length) of nanoscale structures inside samples to be visualized. In this work, a new scheme with Tikhonov regularization was developed to remove the effects of artifacts caused by streak scattering originating from the reflection of the incident beam in the contour regions of the sample. The noise due to streak scattering was successfully removed from the sinogram image and hence the CT image could be reconstructed free from artifacts in the contour regions.

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