Surface and Interface Investigations of Matrix–Fillers in Heterogeneous Amorphous Semiconductors

[Image: see text] Phosphate glass-based composites are prone to be as effective as amorphous semiconductors, enhancing the glass properties by the addition of a small amount of metallic fillers (Cr, Co, Ni, and Zn) and leading to the creation of composite materials where the conductive particles can be distributed in the glass matrix PbO–P(2)O(5) (PbP) at the micrometer level. This paper deals with scanning electron microscopy (SEM) examination and the wetting behavior of the phosphate glass–metal powder composites. We focused on the filler effect on wetting characteristics, such as interfacial free energy. The change in the contact angle of water on the glass surface was also measured. Scanning electron microscopy images of the composites showed a good dispersion in the fillers within the glass matrix. The contact angles of the composites with water and three polar and apolar solvents were calculated. The total solid surface free energy was analyzed. The interaction parameter between the composites and the liquid has been calculated using Owens–Wendt equation.