Integrated wafer-scale manufacturing of electron cryomicroscopy specimen supports

We present a process for the manufacture of electron cryomicroscopy (cryoEM) specimen supports with an integrated foil–grid structure, using cryogenic vacuum evaporation (cryoEvap) and patterned electroplating on a silicon wafer substrate. The process is designed to produce a pattern of nanometre sc...

Descripción completa

Detalles Bibliográficos
Autores principales: Naydenova, Katerina, Russo, Christopher J.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Elsevier 2022
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8689146/
https://www.ncbi.nlm.nih.gov/pubmed/34740028
http://dx.doi.org/10.1016/j.ultramic.2021.113396

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8689146/
https://www.ncbi.nlm.nih.gov/pubmed/34740028
http://dx.doi.org/10.1016/j.ultramic.2021.113396

Ejemplares similares