An Adversarial Learning Approach for Super-Resolution Enhancement Based on AgCl@Ag Nanoparticles in Scanning Electron Microscopy Images

Scanning electron microscopy (SEM) plays a crucial role in the characterization of nanoparticles. Unfortunately, due to the limited resolution, existing imaging techniques are insufficient to display all detailed characteristics at the nanoscale. Hardware-oriented techniques are troubled with costs...

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Detalles Bibliográficos
Autores principales: Fan, Li, Wang, Zelin, Lu, Yuxiang, Zhou, Jianguang
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2021
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8703353/
https://www.ncbi.nlm.nih.gov/pubmed/34947654
http://dx.doi.org/10.3390/nano11123305

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8703353/
https://www.ncbi.nlm.nih.gov/pubmed/34947654
http://dx.doi.org/10.3390/nano11123305

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