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Impedance Analysis and Noise Measurements on Multi Walled Carbon Nanotube Networks
The electrical impedance characteristics of multi-walled carbon nanotube (MWCNTs) networks were studied as a function of CNT concentrations in the frequency range of 1 kHz–1 MHz. The novelty of this study is that the MWCNTs were not embedded in any polymer matrix and so the response of the device to...
Autores principales: | , , , , , , , , |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
MDPI
2021
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8708505/ https://www.ncbi.nlm.nih.gov/pubmed/34947104 http://dx.doi.org/10.3390/ma14247509 |
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author | Philipose, Usha Jiang, Yan Western, Brianna Harcrow, Michael Littler, Chris Sood, Ashok Zeller, John W. Lineberry, Bobby Syllaios, A. J. |
author_facet | Philipose, Usha Jiang, Yan Western, Brianna Harcrow, Michael Littler, Chris Sood, Ashok Zeller, John W. Lineberry, Bobby Syllaios, A. J. |
author_sort | Philipose, Usha |
collection | PubMed |
description | The electrical impedance characteristics of multi-walled carbon nanotube (MWCNTs) networks were studied as a function of CNT concentrations in the frequency range of 1 kHz–1 MHz. The novelty of this study is that the MWCNTs were not embedded in any polymer matrix and so the response of the device to electrical measurements are attributed to the CNTs in the network without any contribution from a polymer host matrix. Devices with low MWCNT packing density (0.31–0.85 µg/cm(2)) exhibit a frequency independent plateau in the low-frequency regime. At higher frequencies, the AC conductivity of these devices increases following a power law, characteristic of the universal dynamic response (UDR) phenomenon. On the other hand, devices with high MWCNT concentrations (>1.0 µg/cm(2)) exhibit frequency independent conductivity over the entire frequency range (up to 1 MHz), indicating that conduction in these devices is due to direct contact between the CNTs in the network. A simple single-relaxation time electrical equivalent circuit with an effective resistance and capacitance is used to describe the device performance. The electrical noise measurements on devices with different MWCNT packing densities exhibit bias-dependent low-frequency 1/f noise, attributed to resistance fluctuations. |
format | Online Article Text |
id | pubmed-8708505 |
institution | National Center for Biotechnology Information |
language | English |
publishDate | 2021 |
publisher | MDPI |
record_format | MEDLINE/PubMed |
spelling | pubmed-87085052021-12-25 Impedance Analysis and Noise Measurements on Multi Walled Carbon Nanotube Networks Philipose, Usha Jiang, Yan Western, Brianna Harcrow, Michael Littler, Chris Sood, Ashok Zeller, John W. Lineberry, Bobby Syllaios, A. J. Materials (Basel) Article The electrical impedance characteristics of multi-walled carbon nanotube (MWCNTs) networks were studied as a function of CNT concentrations in the frequency range of 1 kHz–1 MHz. The novelty of this study is that the MWCNTs were not embedded in any polymer matrix and so the response of the device to electrical measurements are attributed to the CNTs in the network without any contribution from a polymer host matrix. Devices with low MWCNT packing density (0.31–0.85 µg/cm(2)) exhibit a frequency independent plateau in the low-frequency regime. At higher frequencies, the AC conductivity of these devices increases following a power law, characteristic of the universal dynamic response (UDR) phenomenon. On the other hand, devices with high MWCNT concentrations (>1.0 µg/cm(2)) exhibit frequency independent conductivity over the entire frequency range (up to 1 MHz), indicating that conduction in these devices is due to direct contact between the CNTs in the network. A simple single-relaxation time electrical equivalent circuit with an effective resistance and capacitance is used to describe the device performance. The electrical noise measurements on devices with different MWCNT packing densities exhibit bias-dependent low-frequency 1/f noise, attributed to resistance fluctuations. MDPI 2021-12-07 /pmc/articles/PMC8708505/ /pubmed/34947104 http://dx.doi.org/10.3390/ma14247509 Text en © 2021 by the authors. https://creativecommons.org/licenses/by/4.0/Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (https://creativecommons.org/licenses/by/4.0/). |
spellingShingle | Article Philipose, Usha Jiang, Yan Western, Brianna Harcrow, Michael Littler, Chris Sood, Ashok Zeller, John W. Lineberry, Bobby Syllaios, A. J. Impedance Analysis and Noise Measurements on Multi Walled Carbon Nanotube Networks |
title | Impedance Analysis and Noise Measurements on Multi Walled Carbon Nanotube Networks |
title_full | Impedance Analysis and Noise Measurements on Multi Walled Carbon Nanotube Networks |
title_fullStr | Impedance Analysis and Noise Measurements on Multi Walled Carbon Nanotube Networks |
title_full_unstemmed | Impedance Analysis and Noise Measurements on Multi Walled Carbon Nanotube Networks |
title_short | Impedance Analysis and Noise Measurements on Multi Walled Carbon Nanotube Networks |
title_sort | impedance analysis and noise measurements on multi walled carbon nanotube networks |
topic | Article |
url | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8708505/ https://www.ncbi.nlm.nih.gov/pubmed/34947104 http://dx.doi.org/10.3390/ma14247509 |
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