Cargando…
Optical Inspection of 2D Materials: From Mechanical Exfoliation to Wafer‐Scale Growth and Beyond
Optical inspection is a rapid and non‐destructive method for characterizing the properties of two‐dimensional (2D) materials. With the aid of optical inspection, in situ and scalable monitoring of the properties of 2D materials can be implemented industrially to advance the development and progress...
Autores principales: | Lee, Yang‐Chun, Chang, Sih‐Wei, Chen, Shu‐Hsien, Chen, Shau‐Liang, Chen, Hsuen‐Li |
---|---|
Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
John Wiley and Sons Inc.
2021
|
Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8728831/ https://www.ncbi.nlm.nih.gov/pubmed/34716758 http://dx.doi.org/10.1002/advs.202102128 |
Ejemplares similares
-
Exploring the Influence of Material Properties of Epoxy Molding Compound on Wafer Warpage in Fan-Out Wafer-Level Packaging
por: Chuang, Wan-Chun, et al.
Publicado: (2023) -
Heteroepitaxial
Growth of High Optical Quality, Wafer-Scale
van der Waals Heterostrucutres
por: Ludwiczak, Katarzyna, et al.
Publicado: (2021) -
Direct growth of wafer-scale highly oriented graphene on sapphire
por: Chen, Zhaolong, et al.
Publicado: (2021) -
Kerf-Less Exfoliated Thin Silicon Wafer Prepared by Nickel Electrodeposition for Solar Cells
por: Yang, Hyun-Seock, et al.
Publicado: (2019) -
Wafer-scale detachable monocrystalline germanium nanomembranes for the growth of III–V materials and substrate reuse
por: Paupy, Nicolas, et al.
Publicado: (2023)