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Using photoelectron spectroscopy to measure resonant inelastic X-ray scattering: a computational investigation
Resonant inelastic X-ray scattering (RIXS) has become an important scientific tool. Nonetheless, conventional high-resolution (few hundred meV or less) RIXS measurements, especially in the soft X-ray range, require low-throughput grating spectrometers, which limits measurement accuracy. Here, the pe...
| Autores principales: | , , , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
International Union of Crystallography
2022
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| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8733969/ https://www.ncbi.nlm.nih.gov/pubmed/34985437 http://dx.doi.org/10.1107/S1600577521011917 |