Design and Analysis of Soft Error Rate in FET/CNTFET Based Radiation Hardened SRAM Cell

Aerospace equipages encounter potential radiation footprints through which soft errors occur in the memories onboard. Hence, robustness against radiation with reliability in memory cells is a crucial factor in aerospace electronic systems. This work proposes a novel Carbon nanotube field-effect tran...

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Detalles Bibliográficos
Autores principales: Muthu, Bharathi Raj, Pushpa, Ewins Pon, Dhandapani, Vaithiyanathan, Jayaraman, Kamala, Vasanthakumar, Hemalatha, Oh, Won-Chun, Sagadevan, Suresh
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2021
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8747695/
https://www.ncbi.nlm.nih.gov/pubmed/35009576
http://dx.doi.org/10.3390/s22010033

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC8747695/
https://www.ncbi.nlm.nih.gov/pubmed/35009576
http://dx.doi.org/10.3390/s22010033

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